Versatile band structure and electron—phonon coupling in layered PtSe2 with strong interlayer interaction

Large‐Area Black Phosphorus/PtSe2 Schottky Junction for High Operating Temperature Broadband Photodetectors

“…In our case, the PtSe 2 film has a larger dielectric constant of 15 and a surface phonon energy of 58 meV. [ 50 ] Therefore, the BP/PtSe 2 device exhibits weaker temperature dependence. As a result, the large‐area BP/PtSe 2 film nano‐devices display high‐performance broadband photodetection at HOT.…”

“…Moreover, a substrate with higher surface phonon energy should have weaker temperature dependence on carrier mobility. [ 50,51 ] The surface phonon scattering is proportional to the phonon occupation number at temperature T such that the scattering rate can be expressed as Equation (): $$\[ \begin{array}{*{20}{c}}{\tau _{{\rm{ph}}}^{ - 1} = \mathop \sum \limits_i \frac{1}{{{e^{\hbar {w_i}/{K_B}T}} - 1}}}\end{array} \]$$where ℏwi is the surface phonon energy. In our case, the PtSe 2 film has a larger dielectric constant of 15 and a surface phonon energy of 58 meV.…”

Revealing the Modulation Effects on the Electronic Band Structures and Exciton Properties by Stacking Graphene/h-BN/MoS2 Schottky Heterostructures

“…Then, with n and k, other crucial optical parameters of the samples, such as dielectric functions (ε 1 + iε 2 ), optical conductivity (σ 1 F + iσ 2 F ), energy loss functions [Im(ε −1 )], and absorption coefficients (α), can be derived accordingly. 31,32,58 The detailed SE analysis and Kramers−Kronig consistency checking processes were introduced in the Supporting Information, from which we demonstrated that the point-bypoint fitting results were checked by the consistency of the experimental parameters and generated SE data (Figure S4 in Supporting Information), PL and transmittance spectra measurement results. This suggested that during the SE data analysis process, the ellipsometric parameters can be first mathematical inverted using the point-by-point method and then experimentally checked by other experimental results.…”

“…Then, with n and k, other crucial optical parameters of the samples, such as dielectric functions (ε 1 + iε 2 ), optical conductivity (σ 1 F + iσ 2 F ), energy loss functions [Im(ε −1 )], and absorption coefficients (α), can be derived accordingly. 31,32,58 The detailed SE analysis and Kramers−Kronig consistency checking processes were introduced in the Supporting Information, from which we demonstrated that the point-bypoint fitting results were checked by the consistency of the experimental parameters and generated SE data (Figure S4 analysis process, the ellipsometric parameters can be first mathematical inverted using the point-by-point method and then experimentally checked by other experimental results. This method can be fruitfully exploited to obtain reliable optical information on other 2D systems.…”

“…In this study, by using spectroscopic ellipsometry (SE), , we reported broadband (ranging from 200–1000 nm) optical properties of graphene/MoS 2 and graphene/h-BN/MoS 2 heterostructures, including dielectric functions ( ε = ε 1 + i ε 2 ), complex optical conductivity ( σ F = σ F 1 + σ F 2 ), energy loss functions [lm­( ε –1 )], absorption coefficients ( α ), critical points (CPs), and excitons (transition energies and binding energies). The systemically experimental study of the broadband optical properties is also important prerequisites toward its widely popularization and application toward photoelectronic devices.…”