2023
DOI: 10.3390/nano13020274
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Vertical Etching of Scandium Aluminum Nitride Thin Films Using TMAH Solution

Abstract: A wide bandgap, an enhanced piezoelectric coefficient, and low dielectric permittivity are some of the outstanding properties that have made ScxAl1−xN a promising material in numerous MEMS and optoelectronics applications. One of the substantial challenges of fabricating ScxAl1−xN devices is its difficulty in etching, specifically with higher scandium concentration. In this work, we have developed an experimental approach with high temperature annealing followed by a wet etching process using tetramethyl ammon… Show more

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Cited by 11 publications
(4 citation statements)
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“…The Sc 0.20 Al 0.80 N layers were grown on 150 mm Si ⟨100⟩ substrates utilizing the SPTS Sigma-200 PVD system, adopting a reactive sputtering technique. Comprehensive methodologies for determining the specific concentrations of Al/Sc in the films have been documented thoroughly in the work of ref . A crucial step in effectively delineating the SiO 2 /SiN x hard mask (for ScAlN layer etching) involved employing a nickel metal film, approximately 100 nm in thickness, serving as a temporary mask.…”
Section: Experimental Work For Etching Of Scaln Samplementioning
confidence: 99%
See 1 more Smart Citation
“…The Sc 0.20 Al 0.80 N layers were grown on 150 mm Si ⟨100⟩ substrates utilizing the SPTS Sigma-200 PVD system, adopting a reactive sputtering technique. Comprehensive methodologies for determining the specific concentrations of Al/Sc in the films have been documented thoroughly in the work of ref . A crucial step in effectively delineating the SiO 2 /SiN x hard mask (for ScAlN layer etching) involved employing a nickel metal film, approximately 100 nm in thickness, serving as a temporary mask.…”
Section: Experimental Work For Etching Of Scaln Samplementioning
confidence: 99%
“…This nickel layer was subsequently lifted off by utilizing acetone and isopropyl alcohol. Following this, an ICP fluorine process was applied to etch down the SiO 2 /SiN x hard mask layer, thereby exposing the underlying ScAlN layer, as described in refs and .…”
Section: Experimental Work For Etching Of Scaln Samplementioning
confidence: 99%
“…Photonic structures like grating, 5 multislot line, 6 periodic array of nano cavity, 7 and saw tooth‐shaped array 8 are the most common way to design a frequency selective device. In the last decade, several multiple interface systems have been realized for optical waveguides such as metal–insulator (MI), 9 insulator–metal–insulator, 10 piezoelectric material systems, 11–13 and metal–insulator–metal (MIM) 14 . In comparison with all the interface systems, MIM has low‐loss transmission, nanoscale miniaturization, high confinement, wide bandwidth, and large tunability.…”
Section: Introductionmentioning
confidence: 99%
“…Piezoelectric materials such as AlN, ScAlN, and LiNbO3 (LN) have been widely considered for their use in MEMS devices, frequency control, and sensing applications [1][2][3]. In comparison to other piezoelectric materials, LN has a low intrinsic materials loss, a low-temperature coefficient of frequency (TCF), stable electromechanical responses, CMOS (Complementary Metal-Oxide Semiconductor) compatibility, moderate phase velocity but with low dispersion, low RF losses, GHz capability, and, most importantly, a high intrinsic electromechanical coupling coefficient, making it an excellent candidate for piezoelectric applications [4][5][6].…”
Section: Introductionmentioning
confidence: 99%