2010
DOI: 10.1088/1742-6596/245/1/012076
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Vertical stacking of InAs quantum dots for polarization-insensitive semiconductor optical amplifiers

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Cited by 5 publications
(3 citation statements)
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“…There are two main ways of achieving SOA polarization insensitivity-that is, increasing the thickness of the active layer and changing the low-dimensional quantum structure. From Equation (10), it is evident that increasing the thickness of the active layer can increase the confinement factor of the TM mode, thereby reducing the polarization-dependent gain [30,76]. However, the thickening of the active layer also affects the reliability and saturation output power of the SOA, so it is not practical to increase the active layer thickness blindly.…”
Section: Polarization Insensitivitymentioning
confidence: 99%
“…There are two main ways of achieving SOA polarization insensitivity-that is, increasing the thickness of the active layer and changing the low-dimensional quantum structure. From Equation (10), it is evident that increasing the thickness of the active layer can increase the confinement factor of the TM mode, thereby reducing the polarization-dependent gain [30,76]. However, the thickening of the active layer also affects the reliability and saturation output power of the SOA, so it is not practical to increase the active layer thickness blindly.…”
Section: Polarization Insensitivitymentioning
confidence: 99%
“…Recent experiments by T. Inoue et al 12,19,36 showed, without any theoretical guidance, that similar tuning of polarization properties is possible in regular InAs QD stacks where the QD layers are geometrically separated arXiv:1106.0517v1 [cond-mat.mtrl-sci] 2 Jun 2011 FIG. 1: (a)TEM images of three, six, and nine QD layer stacks grown by solid-source molecular-beam epitaxy 12 .…”
mentioning
confidence: 99%
“…Finally the QD layers are capped with a 100nm thick GaAs layer. Further details of our growth process can be found in earlier publications 12,19,23,36 . The crystallographic properties of the stacked QDs are examined using a cross-sectional transmission electron microscope (TEM).…”
mentioning
confidence: 99%