Very-low-energy spin-polarized electron diffraction from Fe(001)

Tillmann, D.; Thiel, R.C.; Kisker, E.

doi:10.1007/bf01313611

Cited by 91 publications

(42 citation statements)

References 3 publications

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“…Many attempts have been made to overcome this problem. Some analyzers with slightly higher efficiency have been reported [43][44][45][46]. Besides the problems due to the small energy spread allowed, the other issue in SEMPA is polarization vector analysis.…”

Section: Spin-polarization Analyzermentioning

confidence: 98%

“…What is the energy spread the spin-polarization analyzer can tolerate for desired specifications, i.e., figure of merit F and/or sensitivity S. Or, vice versa, what degradation of performance of the polarization analyzer does the desired energy width cause. The latter consideration immediately excludes spin-polarization analyzers that need very sharp energy distributions, like analyzers utilizing scattering at very low energies [43][44][45][46]. The compromise that has to be made with such analyzers will be considerably worse than utilizing detectors that accept a very broad energy distribution without loss of performance, like the Mott-polarimeter [13,15] or the Low Energy Diffuse Scattering spin analyzer (LEDS) [19,22].…”

Section: Spin-polarization Analyzermentioning

confidence: 99%

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SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Oepen¹,

Hopster²

2005

NanoScience and Technology

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Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields. IntroductionIn 1982, triggered by the investigations of the energy dependence of the spinpolarization of secondary electrons (SE), the idea emerged to use this effect in a microscope to image magnetic structures [1,2]. The combination of a conventional Scanning Electron Microscope (SEM) and a spin-polarization analyzer promised the potential of investigating magnetic microstructures with high spatial resolution. In 1984, the first spin-SEM was realized by Koike and coworkers [3], followed less than one year later by a microscope built at NIST [4]. The latter group introduced the abbreviation SEMPA, which stands for Scanning Electron Microscope with Polarization Analysis. We will use both acronyms interchangeably. The next instruments followed in Europe [5,6]. A sketch of SEMPA is given in Fig. 7.1. Due to the low depth of information, ultra-clean surfaces are essential, requiring ultrahigh vacuum (UHV) conditions. Since conventional SEMs usually do not operate in UHV, appropriate UHV-compatible columns (or guns) are rare and expensive. Hooked on is the detector system that consists of an electron optic and a spin-polarization analyzer. The optic has to focus the secondaries into the polarization analyzer. The most important feature of the electron optic is the acceptance angle for SE. It is extremely important that the optic collects electrons emitted in the full 2π solid angle.Several microscopes have been realized [7][8][9][10][11][12][13][14], and a few more have been proposed. Basically, all the systems look very similar. Some have attachments for surface

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Section: Spin-polarization Analyzermentioning

confidence: 98%

Section: Spin-polarization Analyzermentioning

confidence: 99%

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Oepen¹,

Hopster²

2005

NanoScience and Technology

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“…In practice only the reflection technique has been used in working spin polarimeters to date. A detector based on lowenergy reflection from a ferromagnetic film has been described by Tillman et al (1989).…”

Section: Measuring the Spin Polarizationmentioning

confidence: 99%

Spin‐polarized Photoelectron Spectroscopy as a Probe of Magnetic Systems

Johnson

Güntherodt

2007

Handbook of Magnetism and Advanced Magnetic Materials

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Spin‐polarized photoelectron spectroscopy has developed into a versatile tool for the study of surface and thin‐film magnetism. In this chapter, we examine the methodology of the technique and its recent application to a number of different problems. We first examine the photoemission process itself followed by a detailed review of spin‐polarization measurement techniques and the related experimental requirements. We review studies of spin‐polarized surface states, interface states, and quantum‐well states followed by studies of the technologically important oxide systems including half‐metallic transition‐metal oxides, ferromagnet/oxide interfaces and the antiferromagnetic cuprates that exhibit high T c Superconductivity. We also discuss the application of high‐resolution photoemission with spin resolving capabilities to the study of spin‐dependent self‐energizing effects.

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“…However, the spinpolarization analysis remained time consuming. The most widely used spin filtering techniques are based on Mott scattering [9], spin-polarized low-energy electron diffraction (SPLEED) [10], or very-low-energy electron diffraction (VLEED) [11,12]. Combined with PES these techniques comprise single-channel detectors and therefore suffer from low efficiency.…”

Section: Introductionmentioning

confidence: 99%

Vectorial spin polarization detection in multichannel spin-resolved photoemission spectroscopy using an Ir(001) imaging spin filter

et al. 2017

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We report on spin-and angular-resolved photoemission spectroscopy using a high-resolution imaging spin filter based on a large Ir(001) crystal enhancing the effective figure of merit for spin detection by a factor of over 10 3 compared to standard single-channel detectors. Furthermore, we review the spin filter preparation and its lifetime. The spin filter efficiency is mapped on a broad range of scattering energies and azimuthal angles. Large spin filter efficiencies are observed for the spin component perpendicular as well as parallel to the scattering plane depending on the azimuthal orientation of the spin filter crystal. A spin rotator capable of manipulating the spin direction prior to detection complements the measurement of three observables, thus allowing for a derivation of all three components of the spin polarization vector in multichannel spin polarimetry. The experimental results nicely agree with spin-polarized low-energy electron diffraction calculations based on a fully relativistic multiple scattering method in the framework of spin-polarized density functional theory.

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Very-low-energy spin-polarized electron diffraction from Fe(001)

Cited by 91 publications

References 3 publications

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

Spin‐polarized Photoelectron Spectroscopy as a Probe of Magnetic Systems

Vectorial spin polarization detection in multichannel spin-resolved photoemission spectroscopy using an Ir(001) imaging spin filter

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