2016
DOI: 10.1063/1.4961937
|View full text |Cite
|
Sign up to set email alerts
|

Very thin and stable thin-film silicon alloy triple junction solar cells by hot wire chemical vapor deposition

Abstract: We present a silicon-based triple junction solar cell that requires a deposition time of less than 15 min for all photoactive layers. As a low-bandgap material, we used thin layers of hydrogenated amorphous silicon germanium with lower band gap than commonly used, which is possible due to the application of hot wire chemical vapor deposition. The triple junction cell shows an initial energy conversion efficiency exceeding 10%, and with a relative performance stability within 6%, the cell shows a high tolerance… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2017
2017
2019
2019

Publication Types

Select...
2
1

Relationship

2
1

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 27 publications
0
2
0
Order By: Relevance
“…When assessing the quality of a photovoltaic absorber material, one should, apart from the photoabsorption and carrier transport properties, which affect the short‐circuit current and the fill factor, also consider other properties, such as the difference between the value of the band gap and the attainable open circuit voltage in a device: for short, the voltage deficit. Voltage deficits that have been reported for state‐of‐the art devices show that devices with a MAPbI 3‐x Cl x perovskite absorber layer (with a voltage deficit, ΔV ~ 0.4 V ) outperform the other studied materials (ΔV ~ 0.4–0.6 V for Cu(In,Ga)Se 2 , ΔV ~ 0.6 V for μc‐Si:H , ΔV ~ 0.7 V for MAPbBr 3 and ΔV ~ 0.8–0.9 V for a‐Si(Ge):H ).…”
Section: Resultsmentioning
confidence: 87%
“…When assessing the quality of a photovoltaic absorber material, one should, apart from the photoabsorption and carrier transport properties, which affect the short‐circuit current and the fill factor, also consider other properties, such as the difference between the value of the band gap and the attainable open circuit voltage in a device: for short, the voltage deficit. Voltage deficits that have been reported for state‐of‐the art devices show that devices with a MAPbI 3‐x Cl x perovskite absorber layer (with a voltage deficit, ΔV ~ 0.4 V ) outperform the other studied materials (ΔV ~ 0.4–0.6 V for Cu(In,Ga)Se 2 , ΔV ~ 0.6 V for μc‐Si:H , ΔV ~ 0.7 V for MAPbBr 3 and ΔV ~ 0.8–0.9 V for a‐Si(Ge):H ).…”
Section: Resultsmentioning
confidence: 87%
“…Thin (b 3 nm) PECVD intrinsic a-Si:H buffer layers were introduced at the i/n and i/p interface in order to improve the contact between these layers. This process is described elsewhere [17]. A schematic representation of such a device is given in Fig.…”
Section: Micropillar A-si:h/shj Tandem Cells Fabricationmentioning
confidence: 99%