2010
DOI: 10.1002/pssb.200945550
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Vibrational spectroscopy of SiO on Si(111)

Abstract: The growth of ultrathin SiO layers on clean Si(111) was observed by in situ infrared spectroscopy under ultra-high vacuum conditions. SiO was deposited by thermal evaporation of SiO powder from a Knudsen cell. A large shift of the SiO main vibrational line, from about 864 cm À1 for sub-monolayer coverage up to the bulk value of SiO at about 982 cm À1 for thicknesses above 10 Å , was observed. The extraordinary low vibrational frequencies for species at the SiO-Si interface corroborate recently published theore… Show more

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Cited by 12 publications
(14 citation statements)
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“…20 It corresponds to stretch frequencies representing the initial stages of Si oxidation on their flat counterparts. [29][30][31] The existence of this loss proves the presence of oxygen atoms on the surface, which also gets more intense with higher O 2 dosage. This peak is also clearly seen with infrared spectroscopy (see below).…”
Section: Plasmonic Excitations and Their Modificationsmentioning
confidence: 99%
See 1 more Smart Citation
“…20 It corresponds to stretch frequencies representing the initial stages of Si oxidation on their flat counterparts. [29][30][31] The existence of this loss proves the presence of oxygen atoms on the surface, which also gets more intense with higher O 2 dosage. This peak is also clearly seen with infrared spectroscopy (see below).…”
Section: Plasmonic Excitations and Their Modificationsmentioning
confidence: 99%
“…Its vibrational energy depends slightly on oxygen coverage, as discussed in ref. 30 Because IR transmittance at normal incidence of light is sensitive only to vibrational dipoles parallel to the surface, the Si-O bonds should have a oblique orientation on the surface. The apparent increase in its intensity with increasing k , however, is not real, since it is due to the normalization of the spectra to the elastic peak at a given k .…”
Section: Plasmonic Excitations and Their Modificationsmentioning
confidence: 99%
“…A recent IR study of the SiO molecular adsorption on clean Si (111) shows a clear shift of the AS1 vibrational band due to distorted oxygen bridges at the interface. 24…”
Section: Introductionmentioning
confidence: 99%
“…The much weaker structure at approximately 715 cm −1 corresponds to the Si stretching mode, a mode with dominating Si displacement (Lehmann et al 1983), sometimes called "bending" mode in the literature. It is important to note that already from 1 nm the IR spectral features of the evaporated SiO films no longer change (Klevenz et al 2010b). Accordingly, the IR dielectric function of the evaporated film already resembles that of bulk SiO (Hjortsberg & Granqvist 1980;Tazawa et al 2006;Klevenz et al 2010a).…”
Section: Resultsmentioning
confidence: 97%