2020
DOI: 10.1002/pssa.202000235
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Visible Emission on Nanostructured CeO2 Thin Films Obtained by Spray Pyrolysis

Abstract: Herein, the influence of the flow rate, substrate temperature, and thermal annealing at 700 C on the optical and structural parameters of nanostructured ceria thin films prepared by ultrasonic spray pyrolysis is evaluated. The morphology, structure, and optical properties are studied by scanning electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy (XPS), and photoluminescence (PL). The spray conditions are optimized for obtaining smooth, dense, and homogeneous nanocrystalline films with gra… Show more

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Cited by 2 publications
(5 citation statements)
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“…In conclusion, in the explored parameter ranges, higher temperatures and fluxes and lower precursor concentration favour faster reaction kinetics, which trigger texture along the (200) direction, while lower temperature and flux, as well as higher precursor concentration, favour slower reaction kinetics, promoting texture along the (111) direction. This result overcomes preceding studies regarding texture control of CeO 2 thin films on glass substrates by USD 13 , but it is consistent with ceria grown on silicon substrates 16 . This is an interesting result that suggests that texture is more influenced by the control of grown conditions than by the nature of the substrate.…”
Section: Introductionsupporting
confidence: 87%
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“…In conclusion, in the explored parameter ranges, higher temperatures and fluxes and lower precursor concentration favour faster reaction kinetics, which trigger texture along the (200) direction, while lower temperature and flux, as well as higher precursor concentration, favour slower reaction kinetics, promoting texture along the (111) direction. This result overcomes preceding studies regarding texture control of CeO 2 thin films on glass substrates by USD 13 , but it is consistent with ceria grown on silicon substrates 16 . This is an interesting result that suggests that texture is more influenced by the control of grown conditions than by the nature of the substrate.…”
Section: Introductionsupporting
confidence: 87%
“…Thus, the crystallite size determination via the Scherrer formula should be read as a minimum and not necessarily as a value well adhered to the real size. When the crystallite sizes are compared with films grown on crystalline (silicon) substrates 16 , similar grain size values are obtained for the (111) direction, but higher values are obtained for the other directions. This could be related to the ceria tendency to grow in a columnar structure.…”
Section: Introductionsupporting
confidence: 52%
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