1993
DOI: 10.1103/physrevb.48.4883
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Visible photoluminescence from oxidized Si nanometer-sized spheres: Exciton confinement on a spherical shell

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Cited by 489 publications
(247 citation statements)
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“…For example, oxidation of high surface area Si occurs readily in ambient and laboratory conditions and is frequently cited to coincide with sudden, drastic changes in the observed PL. 23,51,52,55,[65][66][67] However, the observed increase or decrease in emission energy that oxygen passivation causes varies from study to study.…”
Section: Effect Of Defects On Photoluminescence From Silicon Nanopartmentioning
confidence: 97%
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“…For example, oxidation of high surface area Si occurs readily in ambient and laboratory conditions and is frequently cited to coincide with sudden, drastic changes in the observed PL. 23,51,52,55,[65][66][67] However, the observed increase or decrease in emission energy that oxygen passivation causes varies from study to study.…”
Section: Effect Of Defects On Photoluminescence From Silicon Nanopartmentioning
confidence: 97%
“…68 Changes in the observed PL from nanocrystalline Si have also been attributed to changes in the surface oxidation of nanocrystalline Si domains. For example, in two studies conducted by Kanemitsu and coworkers, 65,70 the group provided evidence for carrier trapping by electronic states resulting from defects at the interface between Si NPs and an a-SiO 2 surface layer. In the latter study, originally non-photoluminescent Si NPs were observed to emit intense 750 nm PL (λ exc = 355 nm) following the formation of an a-SiO 2 surface layer.…”
Section: Effect Of Defects On Photoluminescence From Silicon Nanopartmentioning
confidence: 99%
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