Visual defect obfuscation based self-supervised anomaly detection
YeongHyeon Park,
Sungho Kang,
Myung Jin Kim
et al.
Abstract:Due to scarcity of anomaly situations in the early manufacturing stage, an unsupervised anomaly detection (UAD) approach is widely adopted which only uses normal samples for training. This approach is based on the assumption that the trained UAD model will accurately reconstruct normal patterns but struggles with unseen anomalies. To enhance the UAD performance, reconstruction-by-inpainting based methods have recently been investigated, especially on the masking strategy of suspected defective regions. However… Show more
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