2007
DOI: 10.1088/0957-4484/19/03/035502
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Visual force sensing with flexible nanowire buckling springs

Abstract: A calibrated method of force sensing is demonstrated in which the buckled shape of a long flexible metallic nanowire, referred to as a 'nanoneedle', is interpreted to determine the applied force. An individual needle of 157 nm diameter by 15.6 µm length is grown on an atomic force microscope (AFM) cantilever with a desired orientation (by the method of Yazdanpanah et al 2005 J. Appl. Phys. 98 073510). Using a nanomanipulator the needle is buckled in the chamber of a scanning electron microscope (SEM) and the b… Show more

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Cited by 25 publications
(25 citation statements)
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“…Besides the bending behaviors of nanowires, during practical applications, for example, in nanodevices or nanoelectromechanical systems (NEMs), it is unavoidable for nanowires to sustain an axial compressive load, which, as a result, would induce buckling of nanowires [24][25][26].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Besides the bending behaviors of nanowires, during practical applications, for example, in nanodevices or nanoelectromechanical systems (NEMs), it is unavoidable for nanowires to sustain an axial compressive load, which, as a result, would induce buckling of nanowires [24][25][26].…”
Section: Introductionmentioning
confidence: 99%
“…A decreasing aspect ratio of a fixed-fixed silicon nanowire would induce an increasing critical buckling load [25]. The critical buckling force of a cantilevered silver-gallium alloy nanowire was measured by Dobrokhotov et al [24]. MD calculations about the buckling behavior of nanowires were also done [26,29].…”
Section: Introductionmentioning
confidence: 99%
“…Timoshenko beam theory, which is valid for large deflections, was used to model the deflection shape of the nanoneedle. From these experiments, a E of 68.3 GPa was calculated for a 157-nm diameter, 15.6-µm long Ag 2 Ga nanoneedle [49].…”
Section: Prior Measurements Of E Q and K C Of Ag 2 Ga Nanoneedlesmentioning
confidence: 99%
“…The nano-probes that were grown on atomic force microscopy (AFM) probes were able to perform AFM topography, in both tapping and non-contact modes; and nano-probes on AFM probes were used in voltage lithography [4,77]. Additional studies by Biedermann et al and Dobrokhotov, et al [80,81] used the self-assembled silver gallium nanostructures in force and mass sensing applications.…”
Section: Dmentioning
confidence: 99%