Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning

Abstract

This report studies the visualization of dynamic noise current distribution in switching operation of Si and SiC power devices. The measurement system is developed to identify time-dependent near magnetic field distribution for periodic steady state circuit operation. The experimental results shown in this report demonstrate the usefulness of the developed system to identify the EMI noise generation and to visualize the time variation of noise current distribution in the power conversion circuit.

Application of Frequency-Domain Noise-Source Model to Simulation of Time-Synchronized Near-Magnetic-Field Distribution above a Power Circuit

“…The EMI noise distribution can be visualized by measuring the near-magnetic-field distribution [10]- [23]. The near-magnetic-field distribution can be measured by scanning a magnetic field probe.…”

“…The scanning method is provided in IEC 61967-3 [24]. EMI noise of an integrated circuit is analyzed in [10] and [11], while that of a power circuit is analyzed in [12]- [16] and [18]- [23]. The authors of [22] and [23] developed a measurement system for the timesynchronized near-magnetic-field distribution.…”

“…EMI noise of an integrated circuit is analyzed in [10] and [11], while that of a power circuit is analyzed in [12]- [16] and [18]- [23]. The authors of [22] and [23] developed a measurement system for the timesynchronized near-magnetic-field distribution. A near-magneticfield distribution map for a specific time and frequency can be visualized by the measurement system.…”

Magnetic Coupling Visualization Using Sensitivity to Magnetic Permeability

“…An electromagnetic interference (EMI) scanning system [4], [5] or an electromagnetic field analysis [6] is commonly used to identify the locations of strong magnetic fields. However, a strong magnetic field is not always the source of the radiation that causes EMC problems.…”