2021
DOI: 10.1002/aelm.202100400
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Visualizing the Active Paths in Morphologically Defective Organic Thin‐Film Transistors

Abstract: The ORCID identification number(s) for the author(s) of this article can be found under https://doi.org/10.1002/aelm.202100400.

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Cited by 4 publications
(3 citation statements)
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“…The larger variations for polymorph A might originate from the higher uncertainty of the number of thermal cracks per ribbon per channel that cannot be fully accounted for by simple optical examination. 35…”
Section: Resultsmentioning
confidence: 99%
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“…The larger variations for polymorph A might originate from the higher uncertainty of the number of thermal cracks per ribbon per channel that cannot be fully accounted for by simple optical examination. 35…”
Section: Resultsmentioning
confidence: 99%
“…The larger variations for polymorph A might originate from the higher uncertainty of the number of thermal cracks per ribbon per channel that cannot be fully accounted for by simple optical examination. 35 Although comparing electron mobilities from non-ideal thin film transistors should be done with caution, a much lower average mobility of polymorph B might be expected based on the twisted molecular packing of polymorph B. A twist angle of around 291 was calculated to represent a minimum molecular orientation for the electron charge-transfer integral of PDIderivatives.…”
Section: Field-effect Transistor Measurementsmentioning
confidence: 99%
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