VLSI test through an improved LDA classification algorithm for test cost reduction

Huang, Liang; Song, Tai

doi:10.1016/j.mejo.2022.105461

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VLSI test through an improved LDA classification algorithm for test cost reduction

Cited by 4 publications

References 3 publications

Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

Built in Self Test on Random Test Pattern Generation for Test Compression

Classification of Valid Test Patterns Using Autoencoder for Adaptive Testing In VLSI

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