Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope

Hashimoto, Yoichiro; Takeuchi, S.; Sunaoshi, Takeshi; Yamazawa, Yu

doi:10.1016/j.ultramic.2019.112889

Cited by 12 publications

(4 citation statements)

References 11 publications

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“…Due to these technical limitations, only a small number of electron energy analyser attachments have proved capable of carrying out secondary electron energy spectroscopy (SEES) in the SEM [26][27][28][29] . It should be noted that the ad-hoc attempts of using in-built LVSEM SE detection systems to energy filter the SE detector signal have succeeded in providing image enhancement, but have not proved precise enough to carry out SE energy spectroscopy [30][31][32][33][34][35][36] . This is because their output signals are influenced by tertiary electrons generated by internal electrode scattering and they detect SEs that have a complex mix of different emission angles and energies.…”

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confidence: 99%

Quantitative material analysis using secondary electron energy spectromicroscopy

Han

Zheng

Banerjee

et al. 2020

Sci Rep

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This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energy analyser attachment to detect small changes in the shape of the scattered secondary electron (SE) spectrum and extract out fine structure features from it. Close agreement between experimental and theoretical bulk valance band DOS distributions was obtained for six different test samples, where the normalised root mean square deviation ranged from 2.7 to 6.7%. High accuracy levels of this kind do not appear to have been reported before. The results presented in this paper point towards SEES becoming a quantitative material analysis companion tool for low voltage scanning electron microscopy (LVSEM) and providing new applications for Scanning Auger Microscopy (SAM) instruments.

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confidence: 99%

Quantitative material analysis using secondary electron energy spectromicroscopy

Han

Zheng

Banerjee

et al. 2020

Sci Rep

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“…This hypothesis was verified by collecting the energy profile from a carbide particle (1-blue line) and its neighboring matrix (2-orange line). The profiles were obtained using the filtering capability of the SU-8230 upper detector in a similar manner as reported by Hashimoto and coworkers [37] and are shown in Figure 1. Figure 1(a) shows a typical SE image obtained by the upper detector when collecting the full energy spectrum of secondary electrons, and the secondary electron energy distribution profiles are given in Figure 1(b).…”

Section: Electron Backscatter Diffraction (Ebsd)mentioning

confidence: 84%

Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels

et al. 2021

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The microstructures of quenched and tempered steels have been traditionally explored by transmission electron microscopy (TEM) rather than scanning electron microscopy (SEM) since TEM offers the high resolution necessary to image the structural details that control the mechanical properties. However, scanning electron microscopes, apart from providing larger area coverage, are commonly available and cheaper to purchase and operate compared to TEM and have evolved considerably in terms of resolution. This work presents detailed comparison of the microstructure characterization of quenched and tempered high-strength steels with TEM and SEM electron channeling contrast techniques. For both techniques, similar conclusions were made in terms of large-scale distribution of martensite lath and plates and nanoscale observation of nanotwins and dislocation structures. These observations were completed with electron backscatter diffraction to assess the martensite size distribution and the retained austenite area fraction. Precipitation was characterized using secondary imaging in the SEM, and a deep learning method was used for image segmentation. In this way, carbide size, shape, and distribution were quantitatively measured down to a few nanometers and compared well with the TEM-based measurements. These encouraging results are intended to help the material science community develop characterization techniques at lower cost and higher statistical significance.

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“…Thus, backscattered images can be a proper method to characterize metallic phases [42]. image [43][44] Optical Microscopy possesses a wide field of view, ensuring a high throughput screening and the possibility to collect vast amounts of data (see Fig. 5) for postprocessing and machine learning [35].…”

Section: Figure 3 Schematic Representation Of An Stm Device and An Stm-image [41]mentioning

confidence: 99%

Possibilities of porous-structure representation – an overview

Szűcs

Vehovszky

2021

Acta Tech. Jaurinensis

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Porous media can be found in all areas of scientific life, such as medicine, civil engineering, material science, fluid dynamics. Computing has achieved high efficiency and computational capacity – so far. However, three-dimensional Computational Fluid Dynamics (CFD) simulations of microstructure remain significant challenges. Pore-scale simulations can help understand the physical processes and determine macroscopic parameters such as the high-frequency limit of dynamic tortuosity, viscous, and thermal characteristic lengths. Independent of whether the computational problem is two or three-dimensional, the geometry as input parameter must be prepared. For this reason, geometry representation methods play a crucial role in the analysis at the pore-scale, especially in numerical simulations. In this article, an insight into microstructures’ visualization capabilities is provided essentially for CFD simulations.

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Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope

Cited by 12 publications

References 11 publications

Quantitative material analysis using secondary electron energy spectromicroscopy

Quantitative material analysis using secondary electron energy spectromicroscopy

Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels

Possibilities of porous-structure representation – an overview

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