2007
DOI: 10.1088/0957-0233/18/11/008
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Voltage linearity measurements using a binary Josephson system

Abstract: A fully automated system has been developed for voltage calibrations where fast programmability and extremely low uncertainties are required. This system is based on a binary Josephson junction array with a smallest segment of one single junction. As an important application, the linearity of the 10 mV range of a digital nanovoltmeter was determined with a standard uncertainty better than 1 nV. As a further application of the fast programmability of the binary Josephson system, the standard uncertainty of volt… Show more

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Cited by 18 publications
(14 citation statements)
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“…These values seem to coincide with the previously reported accuracy levels in the DMV linearity measurements using liquid-helium-based JVS systems (typically 0.1 μV/V or better) [7]- [11]. We consider that this is reasonable since the estimated uncertainties are dominated by the uncertainties related to the DVMs themselves, as discussed above.…”
Section: Estimation Of Uncertaintysupporting
confidence: 89%
“…These values seem to coincide with the previously reported accuracy levels in the DMV linearity measurements using liquid-helium-based JVS systems (typically 0.1 μV/V or better) [7]- [11]. We consider that this is reasonable since the estimated uncertainties are dominated by the uncertainties related to the DVMs themselves, as discussed above.…”
Section: Estimation Of Uncertaintysupporting
confidence: 89%
“…The authors have measured the voltage difference at 10 V between the two systems with a relative combined uncertainty of 2.9 parts in 10 11 (k = 2). Today PJVS tend to replace CJVS not only for the calibration of Zener dc references but also for the calibration of the gain and linearity of high precision digital voltmeters through automated measurements [136,137].…”
Section: Conventional Devicesmentioning
confidence: 99%
“…des fils de mesures. Ces mesures permettent de déduire deux paramètres importants pour le voltmètre : le gain et la linéarité [27].…”
Section: Procédure D'étalonnage De Voltmètres Et Nanovoltmètresunclassified
“…Enfin, la mesure des diverses résistances de fuite du circuit de mesure (résis-tances d'isolement du scanner et des câbles de mesure) associée à la mesure des résistances des câbles connectés à la référence à étalonner et la résistance de sortie de la ré-férence à diode Zener sur la sortie 1,018 V (au maximum de 1 kΩ d'après le constructeur) conduit à une incertitude inférieure à 3 × 10 −10 en valeur relative. le gain dérive dans le temps, la linéarité reste relativement stable [27].…”
Section: éTalonnage De Références à Diode Zenerunclassified