2004
DOI: 10.1016/j.jelechem.2003.10.009
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Voltammetric and structural characterization of sputter deposited Al–Mg films

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Cited by 25 publications
(3 citation statements)
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“…(Only few peaks are present in the measured patterns because of the strong preferential orientation of the crystals within the Al–Mg layers. ) …”
Section: Resultsmentioning
confidence: 99%
“…(Only few peaks are present in the measured patterns because of the strong preferential orientation of the crystals within the Al–Mg layers. ) …”
Section: Resultsmentioning
confidence: 99%
“…In this estimation, D(2u) was corrected by subtracting it from an analogous value for a reference sample [22] with g > 10 mm to correct for the effect of instrumental broadening [23]. The grain size for the as-sputtered the T s of 450 8C was found to be g $ 132 nm.…”
Section: Xrd Measurementsmentioning
confidence: 99%
“…Gaminių iš magnio ir jo lydinių naudojimas jūrinėje ir pajūrio aplinkoje, t. y. padidėjusios chloridų koncentracijos ir drėgmės zonoje, susiduria su dar didesnėmis problemomis. Pagrindinė greito korodavimo priežastis yra mažas paviršinio magnio hidroksido sluoksnio korozinis atsparumas (Jones 1996;Grigucevičienė et al 2004a). Magnio lydinių korozinio atsparumo didinimo būdų paieška yra aktuali šiandienos medžiagotyros problema.…”
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