We study the dynamical hysteresis of transport
V –I
characteristics based on the flux creep model characterized by flux diffusion speed
v = v0(j/jc)|j/jc|n. It is shown that there are two sorts of hysteresis loop in the
V –I
curve: clockwise and anticlockwise. The clockwise loop can be observed if
v
is lower by far than the speed of the applied current
va
(, where d
is the sample thickness): . This formula predicts that it is very difficult to observe the
V –I loop in a thin film
because of its small d. Furthermore, the clockwise loop could always be observed if the critical current of the
sample increases with time, whereas the anticlockwise loop could only be explained by the
critical current decreasing with time, no matter which mechanism is responsible for the
critical current’s change. The numerical results could be used to understand experiments on
a variety of samples.