1996
DOI: 10.1103/physrevb.53.r11949
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Vortex pinning by disordered columnar defects in large Josephson junctions

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Cited by 12 publications
(17 citation statements)
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“…Role of bulk pinning in large Josephson junction (where either the length or width of the junction is larger than the Josephson penetration depth k J has been studied for dierent types of defects (periodic or random with varying sizes) by Fehrenbacher et al [8] through exact solution of the sine-Gordon equation. Experimentally also, the improvement of the junction critical current at commensurate¯ux concentration has been observed [9,10]. Such observations prompt one to study the¯ux pinning as well as critical current in a disordered junction array.…”
Section: U N C O R R E C T E D P R O O Fmentioning
confidence: 73%
“…Role of bulk pinning in large Josephson junction (where either the length or width of the junction is larger than the Josephson penetration depth k J has been studied for dierent types of defects (periodic or random with varying sizes) by Fehrenbacher et al [8] through exact solution of the sine-Gordon equation. Experimentally also, the improvement of the junction critical current at commensurate¯ux concentration has been observed [9,10]. Such observations prompt one to study the¯ux pinning as well as critical current in a disordered junction array.…”
Section: U N C O R R E C T E D P R O O Fmentioning
confidence: 73%
“…For example it gives informations on the quality of the junctions. Recent studies by Itzler and Tinkham examine how defects in the coupling affect this maximum current [14,15]. This is important because high T c superconductors can be described as Josephson junctions where the critical current density is a rapidly varying function of the position, due to grain boundaries.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, there have been efforts to explore variations of this system in which patterned defects, of virtually any desired strength and geometry, are added to the junction barrier. [1][2][3][4][5][6][7][8] In the defected regions, the barrier thickness is increased, changing locally the critical current density ͑CCD͒ J c and the magnetic thickness d m of the junction. of the junction.…”
mentioning
confidence: 99%
“…In typical experimental realizations, the barrier thickness in the defected regions is made much greater than that in the defect-free regions. 5,8 Since the tunneling current has a strong ͑exponen-tial͒ dependence on the barrier thickness, we may consider that practically J c ϭ0 in the defected regions. 8 This kind of inhomogeneity attracts the magnetic flux entering a junction in an external magnetic field, in the form of Josephson fluxons.…”
mentioning
confidence: 99%
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