2012 15th Euromicro Conference on Digital System Design 2012
DOI: 10.1109/dsd.2012.139
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Vulnerability Analysis for Custom Instructions

Abstract: Today circuits are becoming more vulnerable to electronic noises and reliable system design has emerged as a key challenge to embedded system design. Logic fault in terms of soft errors or transient faults are now a serious problem for embedded processors. Recent developments in customized embedded processors significantly focus on improving the performance and area of the processor by augmenting it with application specific custom functional units that implement custom instructions. This paper analyzes the ef… Show more

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Cited by 5 publications
(2 citation statements)
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“…The execution time of the tasks are obtained from the real value of six types of benchmark tasks (Fibonacci sequence, Bubble Sorting, Factorial Function, Multiplying Matrix Function, Newton Root and Sum of Squares) and AVF of these tasks are calculated by the method in [18] [19][20] [21]. The results are obtained by taking average of 10 times repetition.…”
Section: Methodsmentioning
confidence: 99%
“…The execution time of the tasks are obtained from the real value of six types of benchmark tasks (Fibonacci sequence, Bubble Sorting, Factorial Function, Multiplying Matrix Function, Newton Root and Sum of Squares) and AVF of these tasks are calculated by the method in [18] [19][20] [21]. The results are obtained by taking average of 10 times repetition.…”
Section: Methodsmentioning
confidence: 99%
“…As outlined by the International Technology Roadmap for Semiconductors (ITRS) [10], vulnerability to soft errors has raised as one of the major reliability metrics of modern VLSI chips including embedded processors [31,32]. When a high-energy particle hits a sensitive region of a CI, a transient glitch is generated.…”
Section: Introductionmentioning
confidence: 99%