1997
DOI: 10.1023/a:1018684726577
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Cited by 9 publications
(3 citation statements)
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“…All these parameters affect the composition, microstructure, surface morphology, and electrical and optical properties of the grown films. Although there were several previous studies on the PLD growth of CIGS [8,[10][11][12][13][14][15], the influence of the pulse repetition rate has barely been investigated. From the experience of the PLD growth of other thin films, such as diamond, AlN, TiO 2 , ZnO, etc., we know that the effect of the repetition rate is equally important [16][17][18][19][20].…”
Section: Page 4 Of 26mentioning
confidence: 99%
“…All these parameters affect the composition, microstructure, surface morphology, and electrical and optical properties of the grown films. Although there were several previous studies on the PLD growth of CIGS [8,[10][11][12][13][14][15], the influence of the pulse repetition rate has barely been investigated. From the experience of the PLD growth of other thin films, such as diamond, AlN, TiO 2 , ZnO, etc., we know that the effect of the repetition rate is equally important [16][17][18][19][20].…”
Section: Page 4 Of 26mentioning
confidence: 99%
“…Site disorder, the replacement of chemical species on a fixed crystallographic lattice, has recently attracted interest across semiconductor research areas as a means to control optoelectronic properties. While site disorder-referred to from here on simply as disorder or the degree of order-has notably been studied as a mechanism for managing properties in chalcogenide transistors and solar cell materials for some time, [1][2][3][4][5] its application to such a vast array of ternary and multinary nitrides and phosphides is a more recent development. 6,7 Insight from broader comparisons of II-IV-N 2 materials has identified relationships between cation species, structural distortion, and electronic structure due to this disorder, 8 and in some systems, site disorder has been investigated as a means of lowering bandgap energies to ideal ranges for targeted applications.…”
Section: Introductionmentioning
confidence: 99%
“…The smaller FWHM is indicative of larger grain size and better crystallinity in the fs-PLD CIGS. Furthermore, the existence of the (220)-oriented peak, which is beneficial for reducing the surface recombination of the CIGS absorber layer due to higher work function, is largely preserved only in films grown by the fs-PLD [13]. Preliminary studies have also shown that the relaxed structure usually accompanies with the broadened peak of (112) orientation, which is associated with high degree of structural disorder [14].…”
Section: Resultsmentioning
confidence: 99%