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“…Thus, understanding heat evacuation in low dimensional thin-film systems is essential to improve the thermal management maturity in future generations of information technology. Currently, existing methods of probing nanoscale thermal measurements rely heavily on scanning thermal microscopy (SThM) (22), a class of contact mode scanning probe microscopy (SPM) techniques in which a thermocuple is integrated within the cantilever. Multiple configurations have been proposed to probe thermal properties with SThM.…”
Section: 2snom Applications In Plasmon-enhanced Organic Photovoltaic...mentioning
confidence: 99%
“…Thus, understanding heat evacuation in low dimensional thin-film systems is essential to improve the thermal management maturity in future generations of information technology. Currently, existing methods of probing nanoscale thermal measurements rely heavily on scanning thermal microscopy (SThM) (22), a class of contact mode scanning probe microscopy (SPM) techniques in which a thermocuple is integrated within the cantilever. Multiple configurations have been proposed to probe thermal properties with SThM.…”
Section: 2snom Applications In Plasmon-enhanced Organic Photovoltaic...mentioning
confidence: 99%