2022
DOI: 10.1007/s12274-022-4259-9
|View full text |Cite
|
Sign up to set email alerts
|

Wafer-scale fabrication of carbon-nanotube-based CMOS transistors and circuits with high thermal stability

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
9
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 14 publications
(9 citation statements)
references
References 22 publications
0
9
0
Order By: Relevance
“…Please refer to the article "Wafer-scale fabrication of carbonnanotube-based CMOS transistors and circuits with high thermal stability" for details. 13 A brief description of the relevant procedures is as follows:…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…Please refer to the article "Wafer-scale fabrication of carbonnanotube-based CMOS transistors and circuits with high thermal stability" for details. 13 A brief description of the relevant procedures is as follows:…”
Section: Methodsmentioning
confidence: 99%
“…47,48 The mechanism of this device follows the basic diode principle to inject holes and electrons to the valence and conductance band of the channel material, respectively, yet it overcomes several limitations of the previously reported schemes. In effect, this diode is created by joining half of the p-type transistor and half of the n-type transistor in an established process 13 together, which is quite similar to how the BFBD is to the doping-free transistors. Electrostatic doping using the established dielectric material provides much higher thermal stability than the aforementioned chemical doping schema, and a high-voltage control gate is no longer necessary.…”
Section: Wafer-scale Device Fabrication and Characterizationmentioning
confidence: 99%
See 2 more Smart Citations
“…25 ALD is ideal for sub-10 nm lm growth with unique and superior growth characteristics, such as wafer-scale growth, excellent uniformity, and CMOS process compatibility. 26,27 In addition, compared with CVD, a common technique for TMDs studies in lab scale, ALD holds many advantages, such as precise controllability (e.g., thickness, morphology, and doping), 28,29 low deposition temperature, and excellent step coverage, 30 all of which that are benecial for the construction of advanced non-planar geometry devices like Fin-FETs and gate-all-around FETs. 31 ALD is based on a self-limiting growth mechanism, and a thin lm is formed on a substrate surface by surface adsorption and chemical reaction.…”
Section: Introductionmentioning
confidence: 99%