2008
DOI: 10.1016/j.jnoncrysol.2008.09.008
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Water diffusion coefficient measurements in deposited silica coatings by the substrate curvature method

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Cited by 12 publications
(8 citation statements)
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“…By considering that one mole of metal reacts with q moles of water, the integration of metal dissolved at each location through the thickness of the film and over time gives the remaining thickness of metal thin films, normalized by its initial thickness h 0 as truerighthh01ttcwhere tnormalc=h0qρMnormalH2O()kDw0M1prefixtanh1kh02/D is the critical time when the thickness reaches zero, ρ is the mass density of metal, M and MH2normalO are the molar masses of metal and water, respectively. The EDR can therefore be estimated according to: truerightv EDR =dhdt=kDwoMqρMH2normalOprefixtanhkho2DTwo free parameters, D and k , are allowed to vary to yield good fits to the measured resistance curves in Figure a–f, where the diffusivity D is constrained to a reasonable range (≈10 −10 −10 −17 cm 2 s −1 ), with reference to diffusivities of water in sputtered silica at RT (≈10 −11 cm 2 s −1 ) and silica glass (≈10 −16 cm 2 s −1 ), since values for the diffusivity of water in metal thin films are not generally available in the literature. The following diffusivities are obtained, D = 6 × 10 −12 cm 2 s −1 at RT and D = 1.2 × 10 −11 cm 2 s −1 at 37 °C for Mg, Mg alloys, and Zn, and D = 1 × 10 −16 cm 2 s −1 at RT and D = 2 × 10 −16 cm 2 s −1 at 37 °C for W and Mo.…”
Section: Resultsmentioning
confidence: 99%
“…By considering that one mole of metal reacts with q moles of water, the integration of metal dissolved at each location through the thickness of the film and over time gives the remaining thickness of metal thin films, normalized by its initial thickness h 0 as truerighthh01ttcwhere tnormalc=h0qρMnormalH2O()kDw0M1prefixtanh1kh02/D is the critical time when the thickness reaches zero, ρ is the mass density of metal, M and MH2normalO are the molar masses of metal and water, respectively. The EDR can therefore be estimated according to: truerightv EDR =dhdt=kDwoMqρMH2normalOprefixtanhkho2DTwo free parameters, D and k , are allowed to vary to yield good fits to the measured resistance curves in Figure a–f, where the diffusivity D is constrained to a reasonable range (≈10 −10 −10 −17 cm 2 s −1 ), with reference to diffusivities of water in sputtered silica at RT (≈10 −11 cm 2 s −1 ) and silica glass (≈10 −16 cm 2 s −1 ), since values for the diffusivity of water in metal thin films are not generally available in the literature. The following diffusivities are obtained, D = 6 × 10 −12 cm 2 s −1 at RT and D = 1.2 × 10 −11 cm 2 s −1 at 37 °C for Mg, Mg alloys, and Zn, and D = 1 × 10 −16 cm 2 s −1 at RT and D = 2 × 10 −16 cm 2 s −1 at 37 °C for W and Mo.…”
Section: Resultsmentioning
confidence: 99%
“…The obtained broad MWDs of the polymers suggest that the silica surface provides only a limited mobility for the catalyst. The limited accessibility of the catalyst on the hydrated surface can be attributed to a reported low self-diffusion coefficient ( D water = 10 –12 –10 –17 cm 2 /s) of water on the silica surface. The self-diffusion coefficient of water on the silica surface is substantially lower than in the Na-clay surface and the bulk water ( D = 2.25 × 10 –5 cm 2 /s) (Table ). , This will decrease the mobility of the catalyst suspended in the hydrated layer and will reduce the deactivation rate of the growing radicals in silica supported catalyst system. Although, the average particle size of silica is much bigger than the clay in this study, the polymerization results are not influenced by the surface area as the nanosilica support also produced PBnMA with broad MWD (Table , run 7, Figure c).…”
Section: Resultsmentioning
confidence: 99%
“…At the heart of this study is an experiment in which water is diffused into one side of thin vitreous silica disks. This technique has been used earlier to determine the volume change caused by the penetration of water into silica coatings on silicon wafers . The consequent volume expansion in the coating resulted in a bending of the disks .…”
Section: Methodsmentioning
confidence: 99%