Abstract:We investigated the H2O‐content dependence of Si self‐diffusion coefficient in Fe‐free wadsleyite using multi‐anvil experiments at pressures of 19–20 GPa, temperatures of 1573–1873 K, and H2O‐content ranging from ∼10 to 5,300 wt. ppm by the isotopic thin‐film diffusion‐couple method. The 29Si‐doped diffusion profiles were measured by nanoscale secondary ion mass spectrometry in the depth profiling mode. The H2O contents in the samples were analyzed by Fourier transformation infrared spectroscopy. The experimen… Show more
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