In this manuscript we report an arrangement utilizing hyperspectral imaging for the unconditional and automated reconstruction of thickness profiles from thin liquid film interferograms. Approaches utilizing hyperspectral imaging (using the pushbroom like techniques) have previously been reported for characterizing static thin films 30,31. However, these approaches are not suited for dynamic films, primarily due to the nature of image acquisition, and to the best of our knowledge have never been modified for use with dynamic films. Here, we describe a compact setup employing a snapshot hyperspectral imager and the related algorithms for automated determination of thickness profiles of thin films. In section "Methods", we detail the theory, the experimental setup and the developed algorithms. In section "Results and discussion", we establish the accuracy of this technique by comparing the absolute pixel-wise differences across the manually reconstructed and the automatically reconstructed thickness profiles. Finally, we conclude the paper by discussing the key advantages and unique characteristics of hyperspectral thin film interferometry.