Wave Optics

Lindlein, Norbert; Leuchs, Gerd

doi:10.1007/978-3-642-19409-2_3

Cited by 2 publications

(2 citation statements)

References 36 publications

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“…The characteristics of a depth profile of a silicon layer are well described in the literature. 5,12 Usually, when covered with a planar polymer layer, a broadened Si signal is expected. 13 However, the signal intensity of the silicon substrate covered with a sphere is significantly decreased and has two broadened peaks.…”

Section: Methodsmentioning

confidence: 99%

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Confocal Raman Microscopy for the Analysis of the Three-Dimensional Shape of Polymeric Microsphere Layers

et al. 2022

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The reconstruction of the three-dimensional (3D) morphology of polymeric microsphere layers based on confocal Raman microscopy was studied. Refraction of the Raman laser beam at the curved surface of the spheres broadens the focus volume inside the sphere. Compared to planar layers, the focus gets trapped inside the spheres such that the measured depth profiles are shifted and broadened. Additionally, the Raman signal of the underlying substrate is already observed for nominal focus positions above the microsphere layer. The results are successfully modeled with ray-optical simulations that allow for a clear understanding of the relevant mechanisms that lead to the generation of the Raman signals in the complex three-dimensional structures.

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Section: Methodsmentioning

confidence: 99%

“…For objectives with an NA > 0.8, the diffraction effect can be neglected. 12 Furthermore, the deeper the position of the nominal focus and the higher the NA, the lower the collection signal.…”

Section: Introductionmentioning

confidence: 99%