Wavelength monitor based on two single-quantum-well absorbers sampling a standing wave pattern

Kung, H.L.; Miller, David A. B.; Atanackovic, Petar; Lin, Chien-Chung; Harris, James S.; Carraresi, L.; Cunningham, J. E.; Jan, W. Y.

doi:10.1063/1.126623

Cited by 6 publications

(5 citation statements)

References 9 publications

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Section: Introductionmentioning

confidence: 99%

“…Light wavelength identification is critical for a wide range of applications, such as intelligent color recognition, , automatic sorting system, tunable diode lasers, missile threat warning, or optical interconnects and plasmonic nanocircuits. , Because of limitations of the carrier transport mechanism, conventional semiconductor photodetectors do not have the capability to identify light wavelength. To achieve wavelength identification, they need the aid of many kinds of auxiliary components, including grating, , filter, macrobending single-mode fiber, distributed Bragg reflector, and resonant cavity …”

Section: Introductionmentioning

confidence: 99%

“…To achieve wavelength identification, they need the aid of many kinds of auxiliary components, including grating, 7,8 filter, 9 macrobending single-mode fiber, 10 distributed Bragg reflector, 11 and resonant cavity. 12 Recently, hot-electron photodetectors have been demonstrated to directly identify the wavelength of monochromatic light with a simple metal/insulator/metal (MIM) structure, 13,14 which significantly reduces the cost and complication of the system and can be compatible with high-compact photonic integration. In these MIM junctions, the hot electrons photoexcited in the top metal layer could emit into the bottom metal layer over the conduction band of the middle insulation layer, inducing a detectable open circuit voltage (V oc ).…”

Section: ■ Introductionmentioning

confidence: 99%

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Ultraviolet Wavelength Identification Using Energy Distribution of Hot Electrons

Liu

Wang

et al. 2017

ACS Omega

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Light wavelength identification is essential for many optical and optoelectronic applications. Here, we report a novel wavelength identification photodetector based on the energy distribution of hot electrons at the metal/insulator interface. The information of the light wavelength can be stored in the energy distribution of the hot electrons, which can then be readout in the form of the current–voltage characteristics. On the basis of this principle, the high-reliability wavelength identification of the monochromatic light has been realized with a simple Al/SiO 2 /Si structure. The device has an excellent stability with dark current below 1 × 10 –7 A/m 2 . Moreover, the wavelength of the monochromatic light in the deep ultraviolet range can be identified. This new principle will pave a new solution to design high-performance single-chip wavelength identification photodetectors and integrated miniaturized wavelength identification systems.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: ■ Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Ultraviolet Wavelength Identification Using Energy Distribution of Hot Electrons

Liu

Wang

et al. 2017

ACS Omega

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“…The utilization of an optical standing wave for length measurement was investigated in the past [2]- [4], but our approach reduces the number of optical components to a minimum. Another interesting application of optical standing waves are Fourier spectrometers [5], [6], which allow the determination of different wavelengths by transparent detectors.…”

Section: Introductionmentioning

confidence: 99%

Optimization of Phase-Sensitive Transparent Detector for Length Measurements

Jun

Bunte

Stiebig

2005

IEEE Trans. Electron Devices

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A phase selective partly transparent detector (PSTD) enables length measurement with nm-accuracy by sampling an optical standing wave. The PSTD consists of two transparent n-i-p photodiodes of amorphous silicon (a-Si:H) which are embedded between three transparent conductive oxide (TCO) layers. The two photodiodes measure the intensity of an optical standing wave by means of absorption layers with thicknesses below 50 nm and thus, provide two photocurrents which are proportional to the intensity at their individual positions. For an optimization of the device performance, simulations based on a standard electromagnetic formalism were performed. The considered thin-film structure is a glass/TCO/n-i-p/TCO/n-i-p/TCO layer sequence. The aim was to design a layer stack which avoids significant distortions of the standing wave while the phase shift between the photocurrents approximately amounts to 90 , since this will minimize the measurement error. The comparison of experimentally determined and simulated data shows that a further adjustment of the fabricated PSTD into an ideal thickness scheme is necessary to enhance the device performance.

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“…Many existing monitoring techniques are based on arrayed waveguide gratings, 1 in-line photodetectors, 2 and multiple quantum well absorbers. 3 But these approaches fail to satisfy the requirements for small size, passive, and planarly integrable wavelength monitors, respectively. A technique using the interference effect in planar waveguides was proposed 4 and has achieved all the above requirements.…”

mentioning

confidence: 99%

Passive wavelength monitor based on multimode interference waveguide

et al. 2003

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A new wavelength monitor based on a multimode interference waveguide is proposed for multiwavelength communication applications. The device characteristics are studied using the beam propagation method. By adjusting the waveguide's geometric length, different wavelength ranges can be addressed. Each device can monitor up to a 50-nm range and has accuracy Ͻ5 Å.Multiwavelength optical communication systems require an effective way for monitoring and controlling wavelength of the light sources. Many existing monitoring techniques are based on arrayed waveguide gratings, 1 in-line photodetectors, 2 and multiple quantum well absorbers. 3 But these approaches fail to satisfy the requirements for small size, passive, and planarly integrable wavelength monitors, respectively. A technique using the interference effect in planar waveguides was proposed 4 and has achieved all the above requirements. However, by restricting to waveguides supporting only two lateral modes, the optimal performance of this approach has not been reached.In this letter, we propose a wavelength monitor based on multimode interference ͑MMI͒ waveguides. By increasing the number of supported lateral modes, the output contrast is improved and the separation between output waveguides can be increased. The latter will improve ease of fabrication and minimize the co-directional coupling effect in the two output waveguides, thus reducing crosstalk. A ratiometric detection scheme is adopted, which allows the input wavelength to be determined independent of power. Moreover, by changing the length of the interference waveguide, the monitoring wavelength range can be adjusted. This device is robust and exhibits all the attractive characteristics of a conventional MMI waveguide, e.g., compactness, polarization insensitivity, 5 and good fabrication tolerances. 6 For easy integration, the MMI wavelength monitor is designed using an InGaAs/InP laser structure, consisting of quantum well layers enclosed with step index cladding and InGaAs contact. The detailed epitaxial layers were given elsewhere. 7 The MMI waveguide is a strip-load waveguide defined by etching the upper cladding. The rib height of 200 nm results in refractive index contrast of approximately 0.007%, and a 12-m-wide waveguide will support 6 lateral modes.The rectangular MMI waveguide, as shown in Fig. 1, has two output waveguides, named ''bar'' and ''cross,'' located symmetrically about the center line. The input waveguide and the bar output waveguide are aligned. The input optical field excites the supported propagation modes, which in turn interfere to form images of the input field along the propagation direction. Self-imaging analysis 5 predicts that the first of such images is a mirror image. If the waveguide is fabricated such that the length of MMI section coincides with the appearance of this mirror image, the input light will be coupled efficiently into the cross waveguide. The first mirror image occurs at a distance of 3L C along the propagation direction, where L C is the coupling lengt...

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Wavelength monitor based on two single-quantum-well absorbers sampling a standing wave pattern

Cited by 6 publications

References 9 publications

Ultraviolet Wavelength Identification Using Energy Distribution of Hot Electrons

Ultraviolet Wavelength Identification Using Energy Distribution of Hot Electrons

Optimization of Phase-Sensitive Transparent Detector for Length Measurements

Passive wavelength monitor based on multimode interference waveguide

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