1988
DOI: 10.1366/0003702884429715
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Wavelength-Resolved Single-Spark Emission Images with the Use of a Charge Coupled Device Detector

Abstract: With the use of charge coupled device observation technology, single spark data have shown a limitation of current sample introduction models for the high-voltage atmospheric pressure spark. Two-dimensional spatial images of wavelength-resolved data show that atomic emission varies not only in position but also in amplitude. Vapor jets are not observed, but rather nebulous clouds of emission, greatly varying in intensity, are seen.

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Cited by 14 publications
(2 citation statements)
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“…My graduate advisor, Professor John P. Walters, who had designed (or worked with others to design) several generations of spatio-temporally resolving optical spectrometers, [1][2][3][4][5][6] once advised me, ''Never build your own spectrometer.'' Now that I and my collaborators have designed and built several spectrometers 7,8 and related optical systems, [9][10][11][12] I recommend to the reader: Never build your own spectrometer-unless doing so is the only way to solve a problem that you care about! But how can one know if the right instrument is already available from a vendor?…”
Section: Introductionmentioning
confidence: 99%
“…My graduate advisor, Professor John P. Walters, who had designed (or worked with others to design) several generations of spatio-temporally resolving optical spectrometers, [1][2][3][4][5][6] once advised me, ''Never build your own spectrometer.'' Now that I and my collaborators have designed and built several spectrometers 7,8 and related optical systems, [9][10][11][12] I recommend to the reader: Never build your own spectrometer-unless doing so is the only way to solve a problem that you care about! But how can one know if the right instrument is already available from a vendor?…”
Section: Introductionmentioning
confidence: 99%
“…The high-voltage spark is very effective for conductive samples, but for poor conductors the technique has several drawbacks, but which may be overcome in several ways (2)(3)(4)(5)(6) but mostly by compacting the analysis samples into electrodes or by using auxiliary conducting electrodes. The demand in material characterization today is, however, more for direct solid-state techniques for trace spectroanalysis of non-conducting materials (7).…”
Section: Introductionmentioning
confidence: 99%