2017
DOI: 10.1063/1.4977421
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Weak ferromagnetism and short range polar order in NaMnF3 thin films

Abstract: The orthorhombically distorted perovskite NaMnF 3 has been predicted to become ferroelectric if an a = c distortion of the bulk Pnma structure is imposed. In order to test this prediction, NaMnF 3 thin films were grown on SrTiO 3 (001) single crystal substrates via molecular beam epitaxy. The best films were smooth and single phase with four different twin domains. In-plane magnetization measurements revealed the presence of antiferromagnetic ordering with weak ferromagnetism below the Néel temperature T N = 6… Show more

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Cited by 7 publications
(6 citation statements)
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“…Therefore, the confirmation of the ferroelectric state in NaMnF 3 is of high importance in the multiferroics field since it would be the first perovskite-like fluoride to exhibit a multiferroic behavior. We note that, in films grown on a conducting SrRuO 3 epi-layers pre-deposited on SrTiO 3 , temperature dependent dielectric measurements showed signs of an onset of low-temperature ferroelectric order-disorder transition, but long range ferroelectric order was not observed above 10 K 17 . For films grown without the SrRuO 3 back contact layer, similar measurements were not possible, and the ferroelectric properties of these films need to be evaluated by other methods.…”
Section: Introductionmentioning
confidence: 70%
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“…Therefore, the confirmation of the ferroelectric state in NaMnF 3 is of high importance in the multiferroics field since it would be the first perovskite-like fluoride to exhibit a multiferroic behavior. We note that, in films grown on a conducting SrRuO 3 epi-layers pre-deposited on SrTiO 3 , temperature dependent dielectric measurements showed signs of an onset of low-temperature ferroelectric order-disorder transition, but long range ferroelectric order was not observed above 10 K 17 . For films grown without the SrRuO 3 back contact layer, similar measurements were not possible, and the ferroelectric properties of these films need to be evaluated by other methods.…”
Section: Introductionmentioning
confidence: 70%
“…X-ray diffraction (XRD) results reported in ref. 17 show that the MBE grown films are mostly relaxed and domains with b- axis in-plane and out-of-plane are both present. Therefore, the majority portions of the films are likely paraelectric.…”
Section: Resultsmentioning
confidence: 92%
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