Weighted support vector regression to vulnerability assessment of electronic devices illuminated or injected by high power microwave

Yan, 金焱 Jin; Yun’an, 胡云安 Hu; Jun, 黄隽 Huang; Jin, 张瑾 Zhang

doi:10.3788/hplpb20142612.123201

强激光与粒子束

2014

DOI: 10.3788/hplpb20142612.123201

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Weighted support vector regression to vulnerability assessment of electronic devices illuminated or injected by high power microwave

金焱 Jin Yan¹,

胡云安 Hu Yun’an²,

黄隽 Huang Jun³

et al.

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Weighted support vector regression to vulnerability assessment of electronic devices illuminated or injected by high power microwave

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