Wettability measurements of agarose thin films patterned by 193 nm ArF excimer laser

Al-Jarwany, Q. A.; Aesa, Abdulsattar A.; Mohammed, A. F.; Walton, C. D.

doi:10.1007/s12648-024-03345-7

Indian J Phys

2024

DOI: 10.1007/s12648-024-03345-7

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Wettability measurements of agarose thin films patterned by 193 nm ArF excimer laser

Q. A. Al-Jarwany,

Abdulsattar A. Aesa,

A. F. Mohammed

et al.

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Wettability measurements of agarose thin films patterned by 193 nm ArF excimer laser

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References 31 publications

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