2009
DOI: 10.1016/j.jeurceramsoc.2009.01.024
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Wetting and adhesion of Si on Si3N4 and BN substrates

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Cited by 65 publications
(24 citation statements)
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References 15 publications
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“…The contact surface of h-BN substrate before the test was subjected to a gentle mechanical polishing on a piece of office paper in order to obtain the initial surface roughness of r a $ 150 nm (the surface profile was measured by NT-MDT NTEGRA Spectra scanning probe microscope-results are not shown in the paper). Contrary to previous reports (Ref 6,8,12), diamond paste was not used at any stage of polishing of h-BN substrates.…”
Section: Methodsmentioning
confidence: 96%
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“…The contact surface of h-BN substrate before the test was subjected to a gentle mechanical polishing on a piece of office paper in order to obtain the initial surface roughness of r a $ 150 nm (the surface profile was measured by NT-MDT NTEGRA Spectra scanning probe microscope-results are not shown in the paper). Contrary to previous reports (Ref 6,8,12), diamond paste was not used at any stage of polishing of h-BN substrates.…”
Section: Methodsmentioning
confidence: 96%
“…It should be also noted that in both cited papers (Ref 6,12), the authors declared that during the substrates surface preparation both silicon carbide grinding papers and diamond pastes of different fractions were applied. By taking into account the fact that h-BN is very soft, we suspect that the SiC and diamond particles might be embedded in the h-BN surface upon polishing steps.…”
Section: Reactivity Inmentioning
confidence: 99%
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“…The only exception is hc-BN, a ceramic for which non-wetting behaviour of Si is observed. However, for this ceramic, boron contamination leads to overdoping of silicon (hundreds of ppm) incompatible with applications in PV-silicon [36]. In the absence of a satisfactory dense material crucible, photovoltaic silicon ingots are currently grown in SiO2 crucibles coated with a silicon nitride powder, which acts as an interface releasing agent between silicon and the crucible.…”
Section: Wetting In Infiltrationmentioning
confidence: 99%
“…Whalen et al [10] showed that hot pressed Si 3 N 4 gave wetting angles of 43-101 in vacuum, and Drevet et al [11] found that sintered Si 3 N 4 had a wetting angle of 821 which decreased to 491 over time in argon. The non-wetting behavior between silicon and Si 3 N 4 was therefore said to be due to the SiO 2 /SiO x N y on the surface of the Si 3 N 4 .…”
Section: Article In Pressmentioning
confidence: 99%