1974
DOI: 10.1007/bf00790688
|View full text |Cite
|
Sign up to set email alerts
|

Wetting of silicon carbide by binary Si-Ti and Si-Cr alloys

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

2
3
0

Year Published

2000
2000
2019
2019

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(5 citation statements)
references
References 1 publication
2
3
0
Order By: Relevance
“…Element mapping of SAC‐1.5 wt% Ti/SiC interface shows that Ti was accumulated on the SAC‐Ti/SiC interface, as shown in Figure B. EDS analysis reveals the new phase marked A, located in the continuous reaction layer, to be TiC, and the similar results were reported by Nomura et al . The XRD pattern of surface near SiC further confirmed the existence of TiC and Ti 5 Si 3 , as shown in Figure .…”
Section: Resultssupporting
confidence: 82%
See 2 more Smart Citations
“…Element mapping of SAC‐1.5 wt% Ti/SiC interface shows that Ti was accumulated on the SAC‐Ti/SiC interface, as shown in Figure B. EDS analysis reveals the new phase marked A, located in the continuous reaction layer, to be TiC, and the similar results were reported by Nomura et al . The XRD pattern of surface near SiC further confirmed the existence of TiC and Ti 5 Si 3 , as shown in Figure .…”
Section: Resultssupporting
confidence: 82%
“…The wettability, reactivity, and surface energy of SiC ceramic were analyzed by Liu et al, attributing the good wetting behavior to the presence of adsorption phenomena and reaction/dissolution phenomena between liquid phase and solid substrate. The wetting process and spreading kinetics of AgCuTi filler and CuTi filler on SiC were analyzed in literatures . Naka et al studied the effect of Ti addition in copper on the wetting behavior on silicon carbide.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…For mono-as well as polycrystalline a-Si, the contact angle (h) values were quite similar, i.e., approximately 38 deg at temperatures near the melting point of silicon. This value agreed reasonably well with the results reported by Whalen and Anderson [5] (40 ± 5 deg in vacuum at 1750 K (1477°C)), Naidich et al [6] (36 deg in vacuum at 1750 K (1477°C)), and Yupko and Gnesin [7] (33 to 37 deg in vacuum at 1720 K (1447°C)). A similar value for the contact angle was reported by Li and Hausner [8,9] (38 deg at 1703 K (1430°C)).…”
Section: Introductionsupporting
confidence: 91%
“…This is due to the fact that silica has a surface energy lower than that of SiC. Values for the surface energy of SiC, additional to those reported by Barsoum and Ownby, 19 have been given by Allen and Kingery, 18 Yupko and Gnesin, 20 and Bruce. 21 Allen and Kingery 18 estimated a surface energy of 0.84 J/m 2 for SiC at 1200°C from sessile drop experiments involving molten tin under vacuum.…”
Section: (2) Wettability Studiesmentioning
confidence: 89%