Heat stress during the post-anthesis phase significantly impacts wheat cultivation. To evaluate the tolerance of advanced wheat lines to heat stress, stress tolerance indices were used under both normal and post-anthesis heat stress conditions. The results showed a decrease in the average yield of advanced lines under both conditions, indicating the negative impact of heat stress on wheat cultivation. The analysis using PCs, biplot, and ranked clusters revealed that line V-21448 had below-average values for RHSI and %YDR, while V-21243 had values close to the average and all other lines had above-average values. Additionally, under normal conditions, V-19532 had the highest values for RHSI and HYT 100-47 had the lowest values for %YDR. In heat stress conditions, HYT 100-47 had the lowest values for both indices. HYT 100-74 and HYT 100-76 had the highest average values for MNP and YDI and were highly stable in the heat environment. Under normal settings, YDI, RHSI, and % YDR showed a positive correlation, while under heat stress conditions, the same traits showed a negative correlation. MNP had a high positive correlation with Yp and Ys, while YDSI had a negative correlation with Yp but a positive correlation with Ys. These results suggest that these traits are useful for identifying advanced lines with increased yield under both conditions.