White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window

Silfhout, Roelof van; Pothin, D.; Martin, Thierry

doi:10.1107/s1600577519015340

Cited by 1 publication

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References 23 publications

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“…A thin diamond film has been widely used for beam diagnostics in many synchrotron radiation and X-ray free-electron laser (XFEL) facilities based on its luminescence and scattering properties including excellent heat resistance and transparency to X-rays (Tono et al, 2011;Park et al, 2018;van Silfhout et al, 2020;Morse et al, 2007). Since the XFEL has excellent monochromatic properties, it is practically sufficient to use a thin diamond film as a luminescence or scattering screen monitor without a high energy resolution to confirm the XFEL beam axis.…”

Section: Introductionmentioning

confidence: 99%

An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis

Kudo¹,

Sano²,

Matsumoto³

et al. 2022

J Synchrotron Radiat

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This work has successfully demonstrated a system for monitoring pink-beam X-rays exiting from a beamline front-end, which has a specific spatial distribution based on each energy component. In this study, the X-rays scattered from a single-crystal chemical-vapor-deposited diamond film were converted into a cross-sectional image using pinhole optics, followed by digitization with a direct detection complementary metal-oxide-semiconductor 2D detector. By using single crystals instead of poly-crystals, good quality images were obtained with no diffraction bright spots. As a result of applying photon energy discrimination using the droplet analysis to the image information, the spatial distribution of each energy component of the undulator radiation was successfully visualized. The result was found to be in good agreement with the theoretically calculated result obtained using the synchrotron radiation calculation code SPECTRA. The new synchrotron radiation beam monitor proposed in this paper can serve as a powerful beam diagnostic tool for diffraction-limited rings that require strict light source stability.

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Section: Introductionmentioning

confidence: 99%

An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis

Kudo¹,

Sano²,

Matsumoto³

et al. 2022

J Synchrotron Radiat

View full text Add to dashboard Cite

show abstract

White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window

Abstract: White beam diagnostics through pinhole imaging of diffusely scattered radiation are presented.

Cited by 1 publication

References 23 publications

An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis

An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis

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