2002
DOI: 10.1107/s0108767301021298
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Whole powder pattern modelling

Abstract: A new approach for the modelling of diffraction patterns without using analytical pro®le functions is described and tested on ball milled f.c.c. Ni powder samples. The proposed whole powder pattern modelling (WPPM) procedure allows a one-step re®nement of microstructure parameters by a direct modelling of the experimental pattern. Lattice parameter and defect content, expressed as dislocation density, outer cut-off radius, contrast factor, twin and deformation fault probabilities), can be re®ned together with … Show more

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Cited by 524 publications
(437 citation statements)
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“…Other factors such as dislocation density, slip activity [32], and the presence of stacking faults can also affect the shape and/or position of diffraction peaks [27]. Warren [39], Randle and Engler [40] developed the XRDLPA approach for the analysis of the microstructure, which was later followed by others [28,[41][42][43][44][45] with some modifications making it possible to determine the crystallite size and microstrain in materials reliably. Similarly to [16,23], the modified Rietveld [46] method has been used in order to characterise microstructures in this investigation.…”
Section: Methods Of X-ray Diffraction Line Profile Analysismentioning
confidence: 99%
“…Other factors such as dislocation density, slip activity [32], and the presence of stacking faults can also affect the shape and/or position of diffraction peaks [27]. Warren [39], Randle and Engler [40] developed the XRDLPA approach for the analysis of the microstructure, which was later followed by others [28,[41][42][43][44][45] with some modifications making it possible to determine the crystallite size and microstrain in materials reliably. Similarly to [16,23], the modified Rietveld [46] method has been used in order to characterise microstructures in this investigation.…”
Section: Methods Of X-ray Diffraction Line Profile Analysismentioning
confidence: 99%
“…Data were analysed using the Whole Powder Pattern Modelling (WPPM) method [44] implemented in the PM2K software [45]. The instrumental resolution function was characterised with the NIST SRM 660a (LaB6) standard [46,45]: all peak profiles of the LaB6 phase were simultaneously fitted with symmetrical pseudo-Voigt functions whose width and shape were constrained according to the Caglioti et al formulae [47].…”
Section: Characterisation Techniquesmentioning
confidence: 99%
“…This is, in turn, convoluted with the specimen broadening function to yield the observation. With whole powder pattern modeling (WPPM) (Scardi & Leoni, 2002), the character of the specimen broadening function is analyzed using functions that explicitly correlate the observation to the microstructural character of the specimen: the result is the set of parameters for the chosen models that are able to best interpret the observation. The term "microstructure" is here employed in a broad sense and includes all specimen-related features that interrupt the regular periodicity of the lattice.…”
Section: Introductionmentioning
confidence: 99%