Abstract. An improved voltage-integration CMOS image sensor is presented. Some circuits is shared between the voltage integration block and the analog-to-digital convertor (ADC) through an optimal operation timing, which makes use of the different input-signals selected by the switches. Dynamic range expansion is realized, whereas the power consuming and the circuit area in the improved structure do not significantly increase because there is only one integrator and one subtracter. The proposed image sensor structure, designed on 0.18um CMOS process under 3.3V supply, verifies the feasibility of the design approach.