2016
DOI: 10.1109/ted.2016.2596785
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Wideband Circular TE21and TE01Mode Converters With Same Exciting Topologies

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Cited by 32 publications
(13 citation statements)
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“…To verify the methodology and simulations, the back-toback measurement for the mode converters was used [5], [6], [23], [24]. Two identical TE 20 mode converters joined backto-back through an overmoded rectangular waveguide were machined from two brass blocks.…”
Section: Fabrication Measurement and Discussionmentioning
confidence: 99%
See 2 more Smart Citations
“…To verify the methodology and simulations, the back-toback measurement for the mode converters was used [5], [6], [23], [24]. Two identical TE 20 mode converters joined backto-back through an overmoded rectangular waveguide were machined from two brass blocks.…”
Section: Fabrication Measurement and Discussionmentioning
confidence: 99%
“…Two types of TE 20 -TE 10 mode converters, based on H -plane dual-bend and tri-bend rectangular waveguides, achieved a conversion efficiency of >95% in a fractional bandwidth of 12.8% and 10.3%, respectively [12]. (3) Another methodology to excite the TE 20 mode was based on a coupling aperture [5], [6], as shown in Fig. 1(c).…”
Section: Introductionmentioning
confidence: 99%
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“…While single target mode converter with known parameters is required for use in RF systems, the method can only get joint complex S-parameters of the two mode converters. Most literatures had to compare the measured |S 21 | curve with the back-to-back simulation results for design verification [13]- [17]. The single device's transmission phase parameters as well as reflection parameters cannot be measured, which are critical in some applications like power combination.…”
Section: Figure 1 Schematic Of the Back-to-back Methods For Measuringmentioning
confidence: 99%
“…These peaks may become so dense in some cases [16]- [18] that it is hard to judge the device's conversion efficiency and meet the test precision requirement of some high performance mode converters, whose required mode conversion efficiency is often higher than 95% and port voltage reflection ratio less than 10% [13]. Wang et al [17] simply explain that these peaks are caused by weak resonators existing between the identical converters, but provide no further tackling way. The other method used in some literatures [1]- [3], [5] is to measure the device's far-field E or H plane radiation pattern.…”
Section: Figure 1 Schematic Of the Back-to-back Methods For Measuringmentioning
confidence: 99%