EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
DOI: 10.1007/978-3-540-85156-1_276
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Wien filter electron optical characteristics determining using shadow projection method

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“…The bore size was tuned to a balance between reasonable dimensions of the field of view and successful acquisition of very-low-energy electrons collimated towards close vicinity of the optical axis and partly escaping detection through the crystal bore. More sophisticated SLEEM arrangements can be capable of detecting all emitted electrons but a complicated electron optical system has to be employed in order to split the primary and signal beams and deflect the latter toward a side attached detector [27]. Through-the-lens detector configurations can be combined with the cathode lens as well.…”
Section: Instrumentsmentioning
confidence: 99%
“…The bore size was tuned to a balance between reasonable dimensions of the field of view and successful acquisition of very-low-energy electrons collimated towards close vicinity of the optical axis and partly escaping detection through the crystal bore. More sophisticated SLEEM arrangements can be capable of detecting all emitted electrons but a complicated electron optical system has to be employed in order to split the primary and signal beams and deflect the latter toward a side attached detector [27]. Through-the-lens detector configurations can be combined with the cathode lens as well.…”
Section: Instrumentsmentioning
confidence: 99%