Work function effects on the positive charging of supported insulating samples exposed to X-rays (as in XPS) and other irradiations

Cazaux, J.

doi:10.1016/j.elspec.2014.01.009

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Work function effects on the positive charging of supported insulating samples exposed to X-rays (as in XPS) and other irradiations

Cited by 3 publications

References 39 publications

A New Design for Secondary Electron Measurement and Application

A New Design for Secondary Electron Measurement and Application

Surface potential and charging of polymer films submitted to defocused electron beam irradiation

Multi-scale Correlated Analysis with Material Surface Treatment for Multipactor Suppression of Space Microwave Devices

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