Wrinkling of extensional thin films through modified large deflection equations analytically and experimentally

Abstract

The stretch-induced wrinkling of thin films is solved through the modified von Kármán large deflection equations by first selecting the suitable deformation expressions that satisfy boundary conditions. Then, adopting the principle of minimum potential energy we obtain the deformations of simply supported rectangular thin films. The obtained significant deflections are nonlinearly elastic and of the lowest order of infinite solutions. The parameters of aspect ratio, the thickness and material of thin films are studied analytically and numerically. The highlighted results of wrinkle amplitude and load are in good agreement with experiments. The methodology also indicates the limit load impending plasticity and predicts the applied load precisely for each wrinkle. Further, it can be extended to the variety of multifunctional orthotropic and multi-layered thin films.

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Mechanical behavior of thin films due to in-plane tensile and fatigue loadings

“…10 Jen and Wu proposed the theoretical and numerical analyses in thin films to predict the wrinkle number corresponding to the applied load until failure and verified the results well with the experimental data. 11 In nanoscale, Ragab et al investigated the graphene nanoribbons due to positive shear stress to determine shear modulus and shear strength in the consideration of aspect ratio, 12 and beyond wrinkling. 13 As for the complicated cases of thin films with holes the related study and research have been found rare until now.…”