X-ray absorption spectroscopy for metal-implanted silica

Abstract

Ion implantation is an effective way to prepare metal nanocluster composite glass thin films. X-ray absorption spectroscopy (XAS) gives unique information on these systems, allowing to track cluster formation and composition, even at sub-nanometer range of size, as well as the metal ions that remain dispersed and bonded to the matrix; the XAS analysis, intrinsically focused on the short-range order, gives information complementary to those obtained by X-ray diffraction that in some interesting cases are crucial to explain the macroscopic optical or magnetic properties of this kind of systems

Gold-based nucleation in implanted silica studied by x-ray absorption spectroscopy

“…The coupling of ion implantation with proper annealing at defined temperature and atmosphere and/or irradiation by laser or ion beams widens the palette of possible morphologies and compositions. Moreover, alloy nanoclusters whose corresponding bulk phase is unstable or metastable at room temperature can be easily obtained [7,8].…”