2022
DOI: 10.1007/s10876-022-02248-z
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X-Ray Diffraction Analysis by Modified Scherrer, Williamson–Hall and Size–Strain Plot Methods of ZnO Nanocrystals Synthesized by Oxalate Route: A Potential Antimicrobial Candidate Against Foodborne Pathogens

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Cited by 44 publications
(11 citation statements)
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“…Non-uniformities in the lattice, such as faulting, dislocations, antiphase domain borders, and grain surface relaxation all contribute to the lattice strain, as shown in Table . Using the Williamson–Hall eq , we may determine the crystallite size and lattice strain. Peak broadening in the diffraction pattern because of experimental errors can be calculated using the following formula. β 0.25em cos nobreak0em.25em⁡ θ = 0.25em 0.89 D + 4 ε 0.25em sin nobreak0em.25em⁡ θ where β is the full width at half-maximum, ε is the lattice strain, D is the average crystallite size, θ is Bragg’s diffraction angle, and the radiation wavelength λ = 0.154056 nm.…”
Section: Resultsmentioning
confidence: 99%
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“…Non-uniformities in the lattice, such as faulting, dislocations, antiphase domain borders, and grain surface relaxation all contribute to the lattice strain, as shown in Table . Using the Williamson–Hall eq , we may determine the crystallite size and lattice strain. Peak broadening in the diffraction pattern because of experimental errors can be calculated using the following formula. β 0.25em cos nobreak0em.25em⁡ θ = 0.25em 0.89 D + 4 ε 0.25em sin nobreak0em.25em⁡ θ where β is the full width at half-maximum, ε is the lattice strain, D is the average crystallite size, θ is Bragg’s diffraction angle, and the radiation wavelength λ = 0.154056 nm.…”
Section: Resultsmentioning
confidence: 99%
“…Using expression , the dislocation density in the nanoparticles has been calculated as follows. δ = 0.25em 15 β 0.25em cos nobreak0em.25em⁡ θ 4 italicaD D = 20.26 nm, a = 0.4089 nm, and β = FWHM. For many material properties, the existence of dislocations is an apex-determining factor . Such defects distort the regular atomic array of a perfect crystal structure.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, the mean crystallite size of the synthesized tin oxide nanoparticles was determined using the Scherrer [32] and modified Scherrer [33,34] formulae, showing that these two values are almost the same( D S =16.47 nm and D MS =16.44 nm) which are mentioned in Table 2, 3. Nonetheless, these two methods do not account for the strain throughout the crystals, they only consider the crystallite size effects on the XRD peak broadening.…”
Section: Resultsmentioning
confidence: 94%
“…This strain-induced model is written in eqn (17), and D W–H denotes the crystallite size measured by the Williamson–Hall model. 29–31 …”
Section: Resultsmentioning
confidence: 99%