2011
DOI: 10.1007/978-3-642-16635-8
|View full text |Cite
|
Sign up to set email alerts
|

X-Ray Diffraction Crystallography

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

3
136
0
5

Year Published

2012
2012
2023
2023

Publication Types

Select...
8
2

Relationship

0
10

Authors

Journals

citations
Cited by 296 publications
(144 citation statements)
references
References 12 publications
3
136
0
5
Order By: Relevance
“…The SMC and raw chitin were characterized by N 2 adsorption isotherms using BET and BJH methods (Quantachrome Instruments, New Win 2, USA) (Brunauer et al 1938;Barrett et al 1951), Fourier transform infrared spectroscopy (FT-IR) (Shimadzu, Prestige 21210045, Japan) (Silverstein et al 2007), X-ray diffraction (XRD) (Rigaku, Miniflex 300, Japan) (Waseda et al 2011) and scanning electron microscopy (SEM) (Jeol, JSM-6610LV, Japan) (Goldstein et al 2003). The particle diameters of SMC and raw chitin were determined using SEM images by the Image J software (NIH Image, USA) (analyze particle method) ).…”
Section: Obtention and Characterization Of Surface Modified Chitinmentioning
confidence: 99%
“…The SMC and raw chitin were characterized by N 2 adsorption isotherms using BET and BJH methods (Quantachrome Instruments, New Win 2, USA) (Brunauer et al 1938;Barrett et al 1951), Fourier transform infrared spectroscopy (FT-IR) (Shimadzu, Prestige 21210045, Japan) (Silverstein et al 2007), X-ray diffraction (XRD) (Rigaku, Miniflex 300, Japan) (Waseda et al 2011) and scanning electron microscopy (SEM) (Jeol, JSM-6610LV, Japan) (Goldstein et al 2003). The particle diameters of SMC and raw chitin were determined using SEM images by the Image J software (NIH Image, USA) (analyze particle method) ).…”
Section: Obtention and Characterization Of Surface Modified Chitinmentioning
confidence: 99%
“…Using the d value of the peaks (110) and (002), and the plane spacing equation, 17 we calculated the values of lattice parameters a and c, respectively (Figure 1). Tetragonal lattice parameters were converted to pseudo-cubic parameters.…”
mentioning
confidence: 99%
“…Structural identification was performed by the Bruker D8 Focus X-ray diffraction (XRD, Ettlingen, Germany) using the Cu K α radiation (λ = 0.15406 nm), in which the Jade software was used to fit the diffraction peaks [25]. The microstructure morphology and phase verification were carried on with the Philips Tecnai G 2 transmission electron microscopy (TEM, Amsterdam, the Netherlands) with the selected-area electron diffraction (SAED) analysis, where the TEM samples were prepared by twin-jet electro-polishing in a solution of 12% HClO 4 + 88% C 2 H 5 OH (volume fraction) at 243 K. Tensile tests were performed at room temperature with a strain rate of 3.5 × 10 −4 s −1 by using a MTS-810 tensile testing machine (MTS, Cary, NC, USA).…”
Section: Methodsmentioning
confidence: 99%