X-ray diffraction patterns from nanocrystalline binary alloys

Lee, Jeong S.; Angelis, R.J. De

doi:10.1016/s0965-9773(96)00045-1

Cited by 29 publications

(8 citation statements)

References 10 publications

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“…In addition to sample broadening of the XRD peaks, the instrumental broadening also contributes to the line broadening [36,37]. Therefore, the diffraction pattern of a NIST certified standard reference material LaB 6 , which does not contribute sample related line broadening from particle size or microstrain, was recorded using the exact same instrument settings as were used for the CeOCs samples.…”

Section: Structure (Xrd)mentioning

confidence: 99%

Structure and corrosion behavior of sputter deposited cerium oxide based coatings with various thickness on Al 2024-T3 alloy substrates

Liu

Huang

Claypool

et al. 2015

Applied Surface Science

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Section: Structure (Xrd)mentioning

confidence: 99%

Structure and corrosion behavior of sputter deposited cerium oxide based coatings with various thickness on Al 2024-T3 alloy substrates

Liu

Huang

Claypool

et al. 2015

Applied Surface Science

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“…Since the breadth of the Bragg peak is the combination of both instrumental and sample dependent effects, it is necessary to collect a diffraction pattern from the line broadening of a standard material such as silicon to determine the instrumental broadening [15]. The instrumental corrected broadening β hkl corresponding to the diffraction peak of Co x Mn y Zn y Fe 2 O 4 was estimated from the relation:…”

Section: W-h Analysismentioning

confidence: 99%

Synthesis, investigation on structural and electrical properties of cobalt doped Mn–Zn ferrite nanocrystalline powders

Bhuvaneswari¹,

Sendhilnathan

Kumar³

et al. 2016

Materials Science-Poland

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Synthesis of Co x Mn y Zn y Fe 2 O 4 (x = 0.1, 0.5, 0.9 and y = 0.45, 0.25, 0.05) nanocrystalline powders was done by chemical co-precipitation method. The crystal structure was determined by using X-ray diffraction (XRD) studies. The crystallite size and lattice parameters were calculated from the XRD data. The XRD results revealed that the crystallite size of the nanocrystalline powder was found to decrease from 37 nm to 28 nm with the substitution of cobalt. The effect of cobalt ions on the crystallization process, the lattice parameters and electrical properties of Mn-Zn ferrites has been also investigated. The AC conductivity increased with an increase in frequency but it decreased with an increase in cobalt content. The complex impedance analysis of the data showed that the resistive and capacitive properties of the Co-Mn-Zn ferrite are predominant due to the fact that the processes are associated with the grains and grain boundaries. The dielectric constant and dielectric loss dependence on doping level and frequency at room temperature were also studied.

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“…To decouple these contributions, it is necessary to collect a diffraction pattern from the line broadening of a standard material such as silicon to determine the instrumental broadening [17]. The instrumental broadening ˇh kl [18] corresponding to the diffraction peak of silver is estimated using the equation.…”

Section: Determination Of Crystallite Size By Scherrer Analysismentioning

confidence: 99%

“…The latter affection may be stronger than the former one and the reaction was accelerated. After PVP was introduced it would react following formula (15)- (17). The chemical reactions are invoked as follows:…”

Section: Samplementioning

confidence: 99%