1993
DOI: 10.1016/0008-6223(93)90109-n
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X-Ray diffraction, thermal expansion, electrical conductivity, and optical microscopy studies of coal-based graphites

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Cited by 120 publications
(71 citation statements)
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“…[31] The β parameter was corrected for instrumental broadening using the expression ߚ = ටߚ ଶ − ߚ ௌ ଶ , where β m is the measured FWHM of the (002) peak for the aerogel and β Si is the FWHM of the (111) peak of a standard single-crystal silicon wafer, which was obtained experimentally. This silicon peak was chosen since it occurs at a 2θ value (28.5°) very close to the (002) graphitic peak.…”
Section: Microstructural Analysis Of Pyrolyzed Aerogelsmentioning
confidence: 99%
“…[31] The β parameter was corrected for instrumental broadening using the expression ߚ = ටߚ ଶ − ߚ ௌ ଶ , where β m is the measured FWHM of the (002) peak for the aerogel and β Si is the FWHM of the (111) peak of a standard single-crystal silicon wafer, which was obtained experimentally. This silicon peak was chosen since it occurs at a 2θ value (28.5°) very close to the (002) graphitic peak.…”
Section: Microstructural Analysis Of Pyrolyzed Aerogelsmentioning
confidence: 99%
“…The conventional XRD patterns are the convolution of instrumental and microstructural effects that contribute to the line profile broadening. In order to analyse the diffraction line profile that is a direct result of the microstructural effects, a standard single crystal silicon sample was used to correct for instrumental broadening [29]. The microstructural effects responsible for the shape profile of the diffraction peaks (line broadening and shift) are the crystallite size distribution and the micro-strain within the crystallites introduced due to lattice defects.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…This approach originated from an empirical line profile fitting procedure developed for non-graphitic, or disordered lamellar carbons [72][73][74]. As such it significantly underestimates domain sizes at high FWHM ratios as shown in Fig.…”
mentioning
confidence: 99%