The diffraction properties of an unusual radical cation-radical anion salt of composition (TMTTF)I.a(TCNQ)2 [(CIoHI2S4)l.a(C12H4N4)2] have been studied by single-crystal X-ray methods.The diffraction patterns show a strong subcell of monoclinic symmetry, space group P2~/n, with a= 3-819(1), b= 13.021 (6), c= 34.827 (14)/~, fl= 91"68 (3) °, V= 1731.1 ,~a, Z= 2 (for the empirical formula 1.3:2), Dm = 1"43 (1), De= 1"433 g cm -3. Intensities for 2731 reflections with l>a(I)were collected by counter methods in this subcell. The structure was solved by conventional heavy-atom Patterson and Fourier methods and has been refined by full-matrix least-squares calculations to a final R value of 0.127. The final weighted R value and goodness-of-fit are 0.114 and 2.5, respectively. The subcell structure is dominated by homologous columns of cations and anions running parallel to the short a axis. The interplanar spacing in the TCNQ columns is small, 3.24 /~, while the spacing in the TMTTF columns is 3.59/~ and corresponds to about the expected van der Waals separation. Among the columns of molecular cations and anions are channels of TMTTF residues (0.6 per subcell). The end-to-end alignment of the TMTTF residues in these channels approximately parallels the a axis and the stacks of cations and anions. Oscillation photographs about the a axis show a set of diffuse layer lines with a period corresponding to 10/3a. These are interpreted as arising from an incipient Peierls distortion of the columns, the first observed in an organic system. The material is a semiconductor with a room temperature conductivity of order 10 .Q-~ cm-~