X-ray divergent-beam (Kossel) technique: A review

Лидер, В. В.

doi:10.1134/s106377451102012x

Cited by 23 publications

(17 citation statements)

References 153 publications

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“…However, in the case of crystals which contain atoms emitting fluorescent radiation in the X-ray regime, similar information can be obtained from Kossel line patterns (Kossel et al, 1935;Lider, 2011). For an easier understanding of the formation of Kossel lines, see the drawing given in Fig.…”

Section: Introductionmentioning

confidence: 98%

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Measurement of synchrotron-radiation-excited Kossel patterns

Bortel¹,

Faigel²,

Tegze³

et al. 2016

J Synchrotron Rad

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Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, twodimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

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Section: Introductionmentioning

confidence: 98%

“…Mostly they are performed in special cameras or in electron microscopes (Lider, 2011) using an electron beam as the primary excitation source to generate X-ray fluorescence. (Here the Kossel pattern created by X-rays should not be confused with the Kikuchi pattern created by electrons.)…”

Section: Introductionmentioning

confidence: 99%

Measurement of synchrotron-radiation-excited Kossel patterns

Bortel¹,

Faigel²,

Tegze³

et al. 2016

J Synchrotron Rad

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“…Strain determination is linked to lattice parameter determination. Taking this into account, various sources on the accuracy of the Kossel technique can be quoted (Tixier & Waché, 1970;Dingley, 1975;Lamaze & Despujols, 1976;Cunningham & Ashbee, 1990;Bö hling & Bauch, 2007;Langer & Daebritz, 2010;Lider, 2011), and the estimates of strain resolution vary from 5 Â 10 À4 to 1 Â 10 À6 . However, most of the strain or lattice parameter determination methods require special crystal orientations or particular configurations of Kossel lines.…”

Section: Introductionmentioning

confidence: 99%

“…Nowadays, with the application of digital cameras for pattern acquisition (Pesci et al, 2006;Bö hling & Bauch, 2007), the analysis of SEM-based Kossel patterns can be automated to a considerable extent. For a review of Kossel diffraction and its applications, see Lider (2011).…”

Section: Introductionmentioning

confidence: 99%

Strain resolution of scanning electron microscopy based Kossel microdiffraction

et al. 2014

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Science Arts & Métiers (SAM)is an open access repository that collects the work of Arts et Métiers ParisTech researchers and makes it freely available over the web where possible. Kossel microdiffraction in a scanning electron microscope enables determination of local elastic strains. With Kossel patterns recorded by a CCD camera and some automation of the strain determination process, this technique may become a convenient tool for analysis of strains. As for all strain determination methods, critical for the applicability of the Kossel technique is its strain resolution. The resolution was estimated in a number of ways: from the simplest tests based on simulated patterns (of an Ni alloy), through analysis of sharp experimental patterns of Ge, to estimates obtained by in situ tensile straining of single crystals of the Ni-based superalloy. In the latter case, the results were compared with those of conventional X-ray diffraction and synchrotron-based Kossel diffraction. In the case of high-quality Ge patterns, a resolution of 1 Â 10 À4 was reached for all strain tensor components; this corresponds to a stress of about 10 MPa. With relatively diffuse patterns from the strained Ni-based superalloy, under the assumption of plane stress, the strain and stress resolutions were 3 Â 10 À4 and 60 MPa, respectively. Experimental and computational conditions for achieving these resolutions are described. The study shows potential perspectives and limits of the applicability of semiautomatic Kossel microdiffraction as a method of local strain determination.

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“… Electrons from an electron gun [3][4][5][6] or a scanning electron microscope [7];  X-ray photons from an x-ray tube [8][9][10] or synchrotron radiation [11][12][13][14]; this case is analogous to the x-ray standing wave technique [14,15] used to study the interfaces of multilayers [16] or x-ray waveguides [17] as well as superficial thin films [18];  Rapid charged particles (proton or ion beam) from an accelerator [19][20][21][22][23][24][25].…”

Section: Introductionmentioning

confidence: 99%

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

Guen

André

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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The Kossel interferences generated by characteristic x-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B 4 C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr K characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.  X-ray photons from an x-ray tube [8][9][10] or synchrotron radiation [11][12][13][14]; this case is analogous to the x-ray standing wave technique [14,15] The technique requires a periodic structure to diffract the emitted radiation, thus it has been applied to study crystals and interferential multilayers. However, to the best of our knowledge, Kossel lines have never been observed in multilayers upon particle excitation. It is the aim of this paper to show that it is possible to study multilayers having a nanoscale period upon proton irradiation through the observation of Kossel lines. Experimental detailsThe multilayer used for this experiment was a Cr/B 4 C/Sc periodic multilayer, whose period was repeated 100 times. The samples were deposited by magnetron sputtering onto a silicon substrate. The thickness of the Cr, B 4 C and Sc layers are 0.60, 0.20 and 0.92 nm respectively, as deduced from x-ray reflectivity (XRR) measurements in the hard and soft xray ranges. Thus the period of the stack is 1.72 nm. Other reflectivity measurements also showed that Cr atoms are present inside the B 4 C layers [26]. The thin B 4 C barrier layers were introduced to prevent the interdiffusion between Cr and Sc layers and can also improve the thermal stability of the stack [27]. The multilayer was capped with a 2.5 nm-thick B 4 C layer in order to prevent it from oxidation. Working with this Cr/B 4 C/Sc multilayer enabled us to measure well-resolved Sc and Cr K lines and to detect them at reasonable grazing angles.Indeed, this kind of short-period multilayer is chosen for microscopy or spectroscopy applications in the water window range [28,29] and requires well defined layers. Possible evolution of the multilayer composition was monitored simultaneously via the elastically backscattered protons detected in a passivated implanted planar silicon (PIPS) detector, placed at 165° with respect to the direction of the proton beam. We present in Figure 1 the spectrum so obtained for a total proton dose of 600 µC. Protons scattered from the Cr and Sc atoms appear in the peak near 1800 keV. The area of this peak was monitored, and did not change during the measurements, indicating no measurable loss of matter induced by the beam. As a further precaution, the proton beam ...

show abstract

X-ray divergent-beam (Kossel) technique: A review

Cited by 23 publications

References 153 publications

Measurement of synchrotron-radiation-excited Kossel patterns

Measurement of synchrotron-radiation-excited Kossel patterns

Strain resolution of scanning electron microscopy based Kossel microdiffraction

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

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