X-ray energy-dispersive powder diffractometry using synchrotron radiation

Buras, B.; Olsen, J. Staun; Gerward, L.

doi:10.1016/0029-554x(76)90845-4

Cited by 39 publications

(20 citation statements)

References 2 publications

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“…As will be seen from the present note, this information can be obtained by expressing the full width at half maximum (6dFwHM) in the d scale as function of d, 0o and A0o. It will also be seen that quite different answers are obtained for large and small d0o, the latter being especially important in view of the use of synchrotron radiation as an X-ray source for energy-dispersive diffractometry (Buras, Gerward & Staun Olsen, 1976;Bordas, Munro & Glazer, 1976;Bordas, Glazer, Howard & Bourdillon, 1977;Buras, Staun Olsen, Gerward, Will & Hinze, 1977).…”

Section: Introductionmentioning

confidence: 99%

Optimum resolution in X-ray energy-dispersive diffractometry

Buras¹,

Nakabayashi²,

Olsen³

1978

J Appl Cryst

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Section: Introductionmentioning

confidence: 99%

Optimum resolution in X-ray energy-dispersive diffractometry

Buras¹,

Nakabayashi²,

Olsen³

1978

J Appl Cryst

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“…Synchrotron radiation also offers the advantages that data can be collected to much higher sin 0/2 values and that, for the equivalent resolution, counting rates are much larger (Buras, Olsen & Gerward, 1976). Fig.…”

Section: (D) X-ray Powder Diffraction:fixed Scattering Anglementioning

confidence: 99%

The Rietveld method in neutron and X-ray powder diffraction

Albinati¹,

Willis²

1982

J Appl Crystallogr

125

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In the Rietveld method of analysing powder diffraction data, the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile. There is no intermediate step of extracting structure factors. I'he method was applied first to diffraction patterns recorded with neutrons at a fixed wavelength. It has now been used successfully for the treatment of results from the four categories of experimental technique, with neutrons or X-rays as the primary radiation and with the scattered intensity measured at a fixed wavelength or at a fixed scattering angle. In this article we discuss the application of the Rietveld method to each of these techniques.

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“…Detailed discussions of SR sources, along with their characteristics and properties may be found in two recent texts on the subject, cf Kunz (1979) and Winick & Doniach (1980). The first utilization of SR for EDXD experiments was made by Buras, Staun Olsen & Gerward (1976) who obtained diffraction spectra from polycrystalline Fe with a Si(Li) detector in 690s and with a Ge detector in 500s at the Deutsches ElektronenSynchrotron, DESY. Independently, Bordas, Glazer, Howard & Bourdillon (1977) used the Daresbury synchrotron, NINA, to measure Debye-Waller factors and structure factors of polycrystalline NaC1 and KC1 samples with EDXD techniques.…”

Section: Introductionmentioning

confidence: 99%

Energy-dispersive measurements of diffracted synchrotron radiation as a function of pressure: applications to phase transitions in KCl and KI

Skelton¹,

Kirkland²,

Qadri³

1982

J Appl Cryst

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Extensive details are presented of an experimental system consisting of a diamond-anvil pressure cell, a Si(Li) detector, a four-axis micropositioning system, and detection electronics assembled for performing energy-dispersive X-ray diffraction measurements with a synchrotron radiation source. Procedures for aligning and calibrating the system at the synchrotron facility are presented and the system is used to examine the first-order structural phase transitions in both KC1 and KI. Structural information has been obtained with this system from the high-pressure environment in a fraction of the time normally required. Diffraction peaks could be identified and measured to an accuracy of +_0" 1 ?/0 within 200 s and to an accuracy of +_0"4?/o within 0-5 s. Optimum ranges for diffraction angles and X-ray photon energies are reported. Volume compress/b/l/ties of KCI and KI in the low-pressure (B1 structure) and the high-pressure (B2 structure) phases are given along with information about the hysteresis loop associated with this transition.

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X-ray energy-dispersive powder diffractometry using synchrotron radiation

Cited by 39 publications

References 2 publications

Optimum resolution in X-ray energy-dispersive diffractometry

Optimum resolution in X-ray energy-dispersive diffractometry

The Rietveld method in neutron and X-ray powder diffraction

Energy-dispersive measurements of diffracted synchrotron radiation as a function of pressure: applications to phase transitions in KCl and KI

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