We critically compare particle induced X-ray emission (PIXE) on the ion microprobe with scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDS) for the characterisation of gunshot residues (GSR). Samples of gunshot residue from several different firearms were collected. Individual particles of GSR were analysed by SEM-EDS using a 30keV electron beam focussed to ~10nm and PIXE using a 2.5MeV proton beam focussed to ~4 microns. PIXE revealed trace or minor elements undetectable by SEM-EDS, and could discriminate GSR indistinguishable by SEM-EDS. Introduction In order to demonstrate that a suspect in a criminal investigation has fired a weapon, police authorities routinely take swabs from the clothing, skin and hair of the suspect and use electron microscopy to search for gunshot residue (GSR) particles on the swabs. These particles are condensation products of the high temperature, high pressure reactions that occur when a firearm is fired and are known to be deposited at the crime scene and on the shooter [1]. The particles are made up of material from the primer, bullet, bullet jacket, cartridge casing and the gun barrel, are spherical, and are of the order of a few microns in diameter. There are several types of particle that are characteristic of gunshot residue, including those containing Pb, Ba and Sb [2].